RE.PUBLIC@POLIMI pubblicazioni di ricerca del Politecnico di Milano

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Mostrati risultati da 1 a 50 di 170
Titolo Data di pubblicazione Autori File
Degradation dynamics for deep scaled p-MOSFET's during hot-carrier stress 1-gen-2002 MONZIO COMPAGNONI, CHRISTIANPIROVANO, AGOSTINOLACAITA, ANDREA LEONARDO
How far will Silicon nanocrystals push the scaling limits of NVMs technologies? 1-gen-2003 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Study of data retention for nanocrystal Flash memories 1-gen-2003 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDOPREVITALI, CRISTIAN +
Program/erase dynamics and channel conduction in nanocrystal memories 1-gen-2003 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Study of nanocrystal memory reliability by CAST structures 1-gen-2004 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Improving floating-gate memory reliability by nanocrystal storage and pulsed tunnel programming 1-gen-2004 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A new channel percolation model for VT shift in discrete-trap memories 1-gen-2004 IELMINI, DANIELEMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Statistical analysis of nanocrystal memory reliability 1-gen-2004 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Optimization of threshold voltage window under tunneling program/erase in nanocrystal memories 1-gen-2005 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO
Program and SILC constraints on NC memories scaling: a Monte Carlo approach 1-gen-2005 GUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDROMONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELELACAITA, ANDREA LEONARDO +
Reliability assessment of discrete-trap memories for NOR applications 1-gen-2005 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDOSOTGIU, RICCARDO
Edge and percolation effects on VT window in nanocrystal memories 1-gen-2005 GUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDROMONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELELACAITA, ANDREA LEONARDO
Modeling of tunneling P/E for nanocrystal memories 1-gen-2005 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO
Threshold-voltage statistics and conduction regimes in nanocrystal memories 1-gen-2006 GUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDROMONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELE
Defects spectroscopy in SiO2 by statistical random telegraph noise analysis 1-gen-2006 GUSMEROLI, RICCARDOMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Temperature dependence of transient and steady-state gate currents in HfO2 capacitors 1-gen-2006 MONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Transient currents in HfO2 and their impact on circuit and memory applications 1-gen-2006 MONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Characterization of transient currents in HfO2 capacitors in the short timescale 1-gen-2006 MONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Extraction of the floating-gate capacitive couplings for drain turn-on estimation in discrete-trap memories 1-gen-2006 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO
A Monte Carlo investigation of nanocrystal memory reliability 1-gen-2006 GUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDROMONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELELACAITA, ANDREA LEONARDO
Statistical constraints in nanocrystal memory scaling 1-gen-2007 GUSMEROLI, RICCARDOMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDRO
Statistical investigation of random telegraph noise Id instabilities in Flash cells at different initial trap-filling conditions 1-gen-2007 MONZIO COMPAGNONI, CHRISTIANGUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Silicon nanocrystal memories: a status update 1-gen-2007 MONZIO COMPAGNONI, CHRISTIANGUSMEROLI, RICCARDOIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO
RTN effects in scaled Flash memory arrays 1-gen-2007 SOTTOCORNOLA SPINELLI, ALESSANDROMONZIO COMPAGNONI, CHRISTIANGUSMEROLI, RICCARDOGHIDOTTI, MICHELELACAITA, ANDREA LEONARDO
First evidence for injection statistics accuracy limitations in NAND Flash constant-current Fowler-Nordheim programming 1-gen-2007 MONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROGUSMEROLI, RICCARDOLACAITA, ANDREA LEONARDO +
Experimental study of data retention in nitride memories by temperature and field acceleration 1-gen-2007 MONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO
Comparison of modeling approaches for the capacitance-voltage and current-voltage characteristics of advanced gate stacks 1-gen-2007 GUSMEROLI, RICCARDOLACAITA, ANDREA LEONARDOMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDRO +
Analytical model for the electron-injection statistics during programming of nanoscale NAND Flash memories 1-gen-2008 MONZIO COMPAGNONI, CHRISTIANGUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Statistical model for random telegraph noise in Flash memories 1-gen-2008 MONZIO COMPAGNONI, CHRISTIANGUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Cycling effect on the random telegraph noise instabilities of NOR and NAND Flash arrays 1-gen-2008 MONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDRO +
Ultimate accuracy for the NAND Flash program algorithm due to the electron injection statistics 1-gen-2008 MONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROGUSMEROLI, RICCARDO +
A new physics-based model for TANOS memories program/erase 1-gen-2008 MONZIO COMPAGNONI, CHRISTIANMACONI, ALESSANDROSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
RTN VT instability from the stationary trap-filling condition: an analytical spectroscopic investigation 1-gen-2008 MONZIO COMPAGNONI, CHRISTIANGUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Investigation of the random telegraph noise instability in scaled Flash memory arrays 1-gen-2008 SOTTOCORNOLA SPINELLI, ALESSANDROMONZIO COMPAGNONI, CHRISTIANGUSMEROLI, RICCARDOGHIDOTTI, MICHELE +
Scaling trends for random telegraph noise in deca-nanometer Flash memories 1-gen-2008 MONZIO COMPAGNONI, CHRISTIANLACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Physical modeling of single-trap RTS statistical distribution in Flash memories 1-gen-2008 MONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Present status and scaling challenges for the NOR Flash memory technology 1-gen-2009 MONZIO COMPAGNONI, CHRISTIANGUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDROIELMINI, DANIELELACAITA, ANDREA LEONARDO +
Investigation of the electron-injection spread in barrier-engineered NAND Flash memories 1-gen-2009 MONZIO COMPAGNONI, CHRISTIANGUSMEROLI, RICCARDOGHIDOTTI, MICHELESOTTOCORNOLA SPINELLI, ALESSANDRO +
Comprehensive analysis of random telegraph noise instability and its scaling in deca-nanometer Flash memories 1-gen-2009 MONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDRO +
Random telegraph noise effect on the programmed threshold-voltage distribution of Flash memories 1-gen-2009 MONZIO COMPAGNONI, CHRISTIANGHIDOTTI, MICHELELACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Granular electron injection and random telegraph noise impact on the programming accuracy of NOR Flash memories 1-gen-2009 MONZIO COMPAGNONI, CHRISTIANGUSMEROLI, RICCARDOGHIDOTTI, MICHELELACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Physical modeling for programming of TANOS memories in the Fowler-Nordheim regime 1-gen-2009 MONZIO COMPAGNONI, CHRISTIANAMOROSO, SALVATORE MARIAMACONI, ALESSANDROSOTTOCORNOLA SPINELLI, ALESSANDRO +
Modeling and simulation approaches for gate current computation 1-gen-2010 SOTTOCORNOLA SPINELLI, ALESSANDROMONZIO COMPAGNONI, CHRISTIAN +
Investigation of the ISPP dynamics and of the programming efficiency of charge-trap memories 1-gen-2010 MACONI, ALESSANDROMONZIO COMPAGNONI, CHRISTIANAMOROSO, SALVATORE MARIAGHIDOTTI, MICHELEPADOVINI, GIORGIO MICHELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Fundamental limitations to the width of the programmed VT distribution of NOR Flash memories 1-gen-2010 MONZIO COMPAGNONI, CHRISTIANGHIDOTTI, MICHELELACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Comprehensive investigation of statistical effects in nitride memories - Part II: Scaling analysis and impact on device performance 1-gen-2010 MONZIO COMPAGNONI, CHRISTIANAMOROSO, SALVATORE MARIAMACONI, ALESSANDROSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Reliability constraints for TANOS memories due to alumina trapping and leakage 1-gen-2010 AMOROSO, SALVATORE MARIAMONZIO COMPAGNONI, CHRISTIANMACONI, ALESSANDROLACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Effect of floating-gate polysilicon depletion on the erase efficiency of NAND Flash memories 1-gen-2010 MONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDRO +
Impact of control-gate and floating-gate design on the electron-injection spread of decananometer NAND Flash memories 1-gen-2010 MONZIO COMPAGNONI, CHRISTIANMICCOLI, CARMINELACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Impact of neutral threshold-voltage spread and electron-emission statistics on data retention of nanoscale NAND Flash 1-gen-2010 MICCOLI, CARMINEMONZIO COMPAGNONI, CHRISTIANAMOROSO, SALVATORE MARIASOTTOCORNOLA SPINELLI, ALESSANDRO +
Mostrati risultati da 1 a 50 di 170
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