MICCOLI, CARMINE

MICCOLI, CARMINE  

DIPARTIMENTO DI ELETTRONICA E INFORMAZIONE (attivo dal 01/01/1900 al 31/12/2012)  

Mostra records
Risultati 1 - 18 di 18 (tempo di esecuzione: 0.055 secondi).
Titolo Data di pubblicazione Autori File
Accelerated reliability testing of Flash memory: accuracy and issues on a 45nm NOR technology 1-gen-2013 MICCOLI, CARMINEMONZIO COMPAGNONI, CHRISTIANLACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Assessment of distributed-cycling schemes on 45nm NOR Flash memory arrays 1-gen-2012 MICCOLI, CARMINEMONZIO COMPAGNONI, CHRISTIANLACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Cycling pattern and read/bake conditions dependence of random telegraph noise in decananometer NAND Flash arrays 1-gen-2015 MICCOLI, CARMINEPAOLUCCI, GIOVANNI MARIAMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDRO +
Impact of control-gate and floating-gate design on the electron-injection spread of decananometer NAND Flash memories 1-gen-2010 MONZIO COMPAGNONI, CHRISTIANMICCOLI, CARMINELACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Impact of neutral threshold-voltage spread and electron-emission statistics on data retention of nanoscale NAND Flash 1-gen-2010 MICCOLI, CARMINEMONZIO COMPAGNONI, CHRISTIANAMOROSO, SALVATORE MARIASOTTOCORNOLA SPINELLI, ALESSANDRO +
Investigation of cycling-induced VT instabilities in NAND Flash cells via compact modeling 1-gen-2012 PAOLUCCI, GIOVANNI MARIAMICCOLI, CARMINEMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Investigation of the programming accuracy of a double-verify ISPP algorithm for nanoscale NAND Flash memories 1-gen-2011 MICCOLI, CARMINEMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO
Investigation of the threshold voltage instability after distributed cycling in nanoscale NAND Flash memory arrays 1-gen-2010 MONZIO COMPAGNONI, CHRISTIANMICCOLI, CARMINEGHIDOTTI, MICHELELACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
A new spectral approach to modeling charge trapping/detrapping in NAND Flash memories 1-gen-2014 PAOLUCCI, GIOVANNI MARIAMONZIO COMPAGNONI, CHRISTIANMICCOLI, CARMINELACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Random telegraph noise-induced sensitivity of data retention to cell position in the programmed distribution of NAND Flash memory arrays 1-gen-2015 RESNATI, DAVIDEMONZIO COMPAGNONI, CHRISTIANPAOLUCCI, GIOVANNI MARIAMICCOLI, CARMINESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Reliability characterization issues for nanoscale Flash memories: a case study on 45-nm NOR devices 1-gen-2013 MICCOLI, CARMINEMONZIO COMPAGNONI, CHRISTIANLACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Resolving discrete emission events: a new perspective for detrapping investigation in NAND Flash memories 1-gen-2013 MICCOLI, CARMINEMONZIO COMPAGNONI, CHRISTIANPAOLUCCI, GIOVANNI MARIALACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Revisiting charge trapping/detrapping in Flash memories from a discrete and statistical standpoint - Part I: VT instabilities 1-gen-2014 PAOLUCCI, GIOVANNI MARIAMONZIO COMPAGNONI, CHRISTIANMICCOLI, CARMINESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Revisiting charge trapping/detrapping in Flash memories from a discrete and statistical standpoint - Part II: on-field operation and distributed-cycling effects 1-gen-2014 PAOLUCCI, GIOVANNI MARIAMONZIO COMPAGNONI, CHRISTIANMICCOLI, CARMINESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A single-electron analysis of NAND Flash memory programming 1-gen-2015 NICOSIA, GIANLUCAPAOLUCCI, GIOVANNI MARIAMONZIO COMPAGNONI, CHRISTIANRESNATI, DAVIDEMICCOLI, CARMINESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
String current in decananometer NAND Flash arrays: a compact-modeling investigation 1-gen-2012 PAOLUCCI, GIOVANNI MARIAMICCOLI, CARMINEMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO
Threshold-voltage instability due to damage recovery in nanoscale NAND Flash memories 1-gen-2011 MICCOLI, CARMINEMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDRO +
Time Dependent Threshold-Voltage Fluctuations in NAND Flash Memories: From Basic Physics to Impact on Array Operation 1-gen-2015 MICCOLI, CARMINEMONZIO COMPAGNONI, CHRISTIAN +