MONZIO COMPAGNONI, CHRISTIAN
MONZIO COMPAGNONI, CHRISTIAN
DIPARTIMENTO DI ELETTRONICA, INFORMAZIONE E BIOINGEGNERIA
3D Monte Carlo simulation of the programming dynamics and their statistical variability in nanoscale charge-trap memories
2010-01-01 Amoroso, SALVATORE MARIA; Maconi, Alessandro; A., Mauri; MONZIO COMPAGNONI, Christian; E., Greco; E., Camozzi; S., Vigano'; P., Tessariol; A., Ghetti; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO
A comparison of modeling approaches for current transport in polysilicon‑channel nanowire and macaroni GAA MOSFETs
2021-01-01 Mannara, Aurelio; Malavena, Gerardo; SOTTOCORNOLA SPINELLI, Alessandro; MONZIO COMPAGNONI, Christian
A Monte Carlo investigation of nanocrystal memory reliability
2006-01-01 Gusmeroli, Riccardo; SOTTOCORNOLA SPINELLI, Alessandro; MONZIO COMPAGNONI, Christian; Ielmini, Daniele; Lacaita, ANDREA LEONARDO
A new channel percolation model for VT shift in discrete-trap memories
2004-01-01 Ielmini, Daniele; MONZIO COMPAGNONI, Christian; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; C., Gerardi
A new erase saturation issue in cylindrical junction-less charge-trap memory arrays
2012-01-01 Maconi, Alessandro; MONZIO COMPAGNONI, Christian; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO
A new physics-based model for TANOS memories program/erase
2008-01-01 A., Mauri; MONZIO COMPAGNONI, Christian; S., Amoroso; Maconi, Alessandro; F., Cattaneo; A., Benvenuti; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO
A new spectral approach to modeling charge trapping/detrapping in NAND Flash memories
2014-01-01 Paolucci, GIOVANNI MARIA; MONZIO COMPAGNONI, Christian; Miccoli, Carmine; M., Bertuccio; S., Beltrami; J., Barber; J., Kessenich; Lacaita, ANDREA LEONARDO; SOTTOCORNOLA SPINELLI, Alessandro; A., Visconti
A Noise-Resilient Neuromorphic Digit Classifier Based on NOR Flash Memories with Pulse-Width Modulation Scheme
2021-01-01 Malavena, G.; Sottocornola Spinelli, A.; Monzio Compagnoni, C.
A Semi-Analytical Model for Macaroni MOSFETs With Application to Vertical Flash Memories
2016-01-01 Paolucci, Giovanni M.; SOTTOCORNOLA SPINELLI, Alessandro; MONZIO COMPAGNONI, Christian; Tessariol, Paolo
A single-electron analysis of NAND Flash memory programming
2015-01-01 Nicosia, Gianluca; Paolucci, GIOVANNI MARIA; MONZIO COMPAGNONI, Christian; Resnati, Davide; Miccoli, Carmine; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; Visconti, A.; Goda, A.
A Step Ahead Toward a New Microscopic Picture for Charge Trapping/detrapping in Flash Memories
2016-01-01 Resnati, Davide; MONZIO COMPAGNONI, Christian; Paolucci, Giovanni M.; Miccoli, Carmine; Barber, John; Bertuccio, Massimo; Beltrami, Silvia; Lacaita, ANDREA LEONARDO; SOTTOCORNOLA SPINELLI, Alessandro; Visconti, Angelo
Accelerated reliability testing of Flash memory: accuracy and issues on a 45nm NOR technology
2013-01-01 M., Calabrese; Miccoli, Carmine; MONZIO COMPAGNONI, Christian; L., Chiavarone; S., Beltrami; A., Parisi; S., Bartolone; Lacaita, ANDREA LEONARDO; SOTTOCORNOLA SPINELLI, Alessandro; A., Visconti
Accuracy and issues of the spectroscopic analysis of RTN traps in nanoscale MOSFETs
2013-01-01 F., Adamu Lema; MONZIO COMPAGNONI, Christian; Amoroso, SALVATORE MARIA; Castellani, Niccolo'; L., Gerrer; S., Markov; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; A., Asenov
Analysis of High-Temperature Data Retention in 3D Floating-Gate NAND Flash Memory Arrays
2023-01-01 Malavena, Gerardo; Giulianini, Mattia; Chiavarone, Luca; SOTTOCORNOLA SPINELLI, Alessandro; MONZIO COMPAGNONI, Christian
Analytical model for the electron-injection statistics during programming of nanoscale NAND Flash memories
2008-01-01 MONZIO COMPAGNONI, Christian; Gusmeroli, Riccardo; SOTTOCORNOLA SPINELLI, Alessandro; A., Visconti
Assessment of distributed-cycling schemes on 45nm NOR Flash memory arrays
2012-01-01 Miccoli, Carmine; MONZIO COMPAGNONI, Christian; L., Chiavarone; S., Beltrami; Lacaita, ANDREA LEONARDO; SOTTOCORNOLA SPINELLI, Alessandro; A., Visconti
Assessment of the statistical impedance field method for the analysis of the RTN amplitude in nanoscale MOS devices
2013-01-01 G., Torrente; Castellani, Niccolo'; A., Ghetti; MONZIO COMPAGNONI, Christian; Lacaita, ANDREA LEONARDO; SOTTOCORNOLA SPINELLI, Alessandro; A., Benvenuti
Characterization and Modeling of Current Transport in Metal/Ferroelectric/Semiconductor Tunnel Junctions
2020-01-01 Franchini, G.; Sottocornola Spinelli, A.; Nicosia, G.; Fumagalli, I.; Asa, M.; Groppi, C.; Rinaldi, C.; Lacaita, A. L.; Bertacco, R.; Monzio Compagnoni, C.
Characterization and modeling of temperature effects in 3-D NAND Flash arrays - Part I: Polysilicon-induced variability
2018-01-01 Resnati, Davide; Mannara, Aurelio; Nicosia, Gianluca; Paolucci, Giovanni M.; Tessariol, Paolo; Spinelli, Alessandro S.; Lacaita, Andrea L.; MONZIO COMPAGNONI, Christian
Characterization and modeling of temperature effects in 3-D NAND Flash arrays - Part II: Random telegraph noise
2018-01-01 Nicosia, G.; Mannara, A.; Resnati, D.; Paolucci, G. M.; Tessariol, P.; Spinelli, A. S.; Lacaita, A. L.; Goda, A.; Monzio Compagnoni, C.