MONZIO COMPAGNONI, CHRISTIAN

MONZIO COMPAGNONI, CHRISTIAN  

DIPARTIMENTO DI ELETTRONICA, INFORMAZIONE E BIOINGEGNERIA  

Risultati 1 - 20 di 142 (tempo di esecuzione: 0.01 secondi).
Titolo Data di pubblicazione Autore(i) File
3D Monte Carlo simulation of the programming dynamics and their statistical variability in nanoscale charge-trap memories 1-gen-2010 AMOROSO, SALVATORE MARIAMACONI, ALESSANDROMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Accelerated reliability testing of Flash memory: accuracy and issues on a 45nm NOR technology 1-gen-2013 MICCOLI, CARMINEMONZIO COMPAGNONI, CHRISTIANLACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Accuracy and issues of the spectroscopic analysis of RTN traps in nanoscale MOSFETs 1-gen-2013 MONZIO COMPAGNONI, CHRISTIANAMOROSO, SALVATORE MARIACASTELLANI, NICCOLO'SOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Analytical model for the electron-injection statistics during programming of nanoscale NAND Flash memories 1-gen-2008 MONZIO COMPAGNONI, CHRISTIANGUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Assessment of distributed-cycling schemes on 45nm NOR Flash memory arrays 1-gen-2012 MICCOLI, CARMINEMONZIO COMPAGNONI, CHRISTIANLACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Assessment of the statistical impedance field method for the analysis of the RTN amplitude in nanoscale MOS devices 1-gen-2013 CASTELLANI, NICCOLO'MONZIO COMPAGNONI, CHRISTIANLACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Characterization and Modeling of Current Transport in Metal/Ferroelectric/Semiconductor Tunnel Junctions 1-gen-2020 G. FranchiniA. Sottocornola SpinelliG. NicosiaM. AsaC. GroppiC. RinaldiA. L. LacaitaR. BertaccoC. Monzio Compagnoni +
Characterization and modeling of temperature effects in 3-D NAND Flash arrays - Part I: Polysilicon-induced variability 1-gen-2018 Davide ResnatiAurelio MannaraGianluca NicosiaAlessandro S. SpinelliAndrea L. LacaitaChristian Monzio Compagnoni +
Characterization and modeling of temperature effects in 3-D NAND Flash arrays - Part II: Random telegraph noise 1-gen-2018 G. NicosiaA. MannaraD. ResnatiA. L. LacaitaC. Monzio Compagnoni +
Characterization and modeling of the band-to-band current variability of nanoscale device junctions 1-gen-2013 MONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Characterization of transient currents in HfO2 capacitors in the short timescale 1-gen-2006 MONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Charge retention phenomena in charge transfer silicon nitride: impact of technology and operating conditions 1-gen-2011 AMOROSO, SALVATORE MARIAMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROMACONI, ALESSANDRO +
Comments on "A general and transformable model platform for emerging multi-gate MOSFETs" 1-gen-2017 SOTTOCORNOLA SPINELLI, ALESSANDROMONZIO COMPAGNONI, CHRISTIAN +
Compact modeling of GIDL-assisted erase in 3-D NAND Flash strings 1-gen-2019 G. MalavenaA. MannaraA. L. LacaitaA. Sottocornola SpinelliC. Monzio Compagnoni
Compact modeling of variability effects in nanoscale NAND Flash memories 1-gen-2011 MONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDRO +
A comparison of modeling approaches for current transport in polysilicon‑channel nanowire and macaroni GAA MOSFETs 1-gen-2021 Aurelio MannaraGerardo MalavenaAlessandro Sottocornola SpinelliChristian Monzio Compagnoni
Comparison of modeling approaches for the capacitance-voltage and current-voltage characteristics of advanced gate stacks 1-gen-2007 GUSMEROLI, RICCARDOLACAITA, ANDREA LEONARDOMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDRO +
Comprehensive analysis of random telegraph noise instability and its scaling in deca-nanometer Flash memories 1-gen-2009 MONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDRO +
Comprehensive investigation of statistical effects in nitride memories - Part I: Physics-based modeling 1-gen-2010 MONZIO COMPAGNONI, CHRISTIANAMOROSO, SALVATORE MARIAMACONI, ALESSANDROSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Comprehensive investigation of statistical effects in nitride memories - Part II: Scaling analysis and impact on device performance 1-gen-2010 MONZIO COMPAGNONI, CHRISTIANAMOROSO, SALVATORE MARIAMACONI, ALESSANDROSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +