SOTTOCORNOLA SPINELLI, ALESSANDRO
SOTTOCORNOLA SPINELLI, ALESSANDRO
DIPARTIMENTO DI ELETTRONICA, INFORMAZIONE E BIOINGEGNERIA
Alessandro Spinelli; Alessandro S. Spinelli
2D QM simulation and optimization of decanano non-overlapped MOS devices
2003-01-01 Gusmeroli, Riccardo; SOTTOCORNOLA SPINELLI, Alessandro; Pirovano, Agostino; Lacaita, ANDREA LEONARDO; F., Boeuf; T., Skotnicki
3D Monte Carlo simulation of the programming dynamics and their statistical variability in nanoscale charge-trap memories
2010-01-01 Amoroso, SALVATORE MARIA; Maconi, Alessandro; A., Mauri; MONZIO COMPAGNONI, Christian; E., Greco; E., Camozzi; S., Vigano'; P., Tessariol; A., Ghetti; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO
A comparative study of characterization techniques for oxide reliability in Flash memories
2004-01-01 Ielmini, Daniele; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; M. J., VAN DUUREN
A Multi-Channel Low-Power IC for Neural Spike Recording with Data Compression and Narrowband 400-MHz MC-FSK Wireless Transmission
2010-01-01 Bonfanti, ANDREA GIOVANNI; M., Ceravolo; Zambra, Guido; Gusmeroli, Riccardo; Borghi, Tommaso; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO
A new two-trap tunneling model for the anomalous stress-induced leakage current (SILC) in Flash memories
2001-01-01 Ielmini, Daniele; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; A., Modelli
A recombination model for transient and stationary stress-induced leakage current
2000-01-01 Ielmini, Daniele; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; A., Martinelli; G., Ghidini
A recombination- and trap-assisted tunneling model for stress-induced leakage current
2001-01-01 Ielmini, Daniele; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; A., Martinelli; G., Ghidini
A statistical model for SILC in Flash memories
2002-01-01 Ielmini, Daniele; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; A., Modelli
A study of hot-hole injection during programming drain disturb in Flash memories
2006-01-01 Ielmini, Daniele; A., Ghetti; SOTTOCORNOLA SPINELLI, Alessandro; A., Visconti
Accelerated reliability testing of Flash memory: accuracy and issues on a 45nm NOR technology
2013-01-01 M., Calabrese; Miccoli, Carmine; MONZIO COMPAGNONI, Christian; L., Chiavarone; S., Beltrami; A., Parisi; S., Bartolone; Lacaita, ANDREA LEONARDO; SOTTOCORNOLA SPINELLI, Alessandro; A., Visconti
Accuracy and issues of the spectroscopic analysis of RTN traps in nanoscale MOSFETs
2013-01-01 F., Adamu Lema; MONZIO COMPAGNONI, Christian; Amoroso, SALVATORE MARIA; Castellani, Niccolo'; L., Gerrer; S., Markov; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; A., Asenov
Accurate Boundary Integral Calculation in Semiconductor Device Simulation
2006-01-01 Gusmeroli, Riccardo; SOTTOCORNOLA SPINELLI, Alessandro
Actively quenched single-photon avalanche diode for high repetition rate time-gated photon counting
1996-01-01 SOTTOCORNOLA SPINELLI, Alessandro; L. M., Davis; H., Dautet
An analytical model for flat-band polysilicon quantization in MOS devices
2002-01-01 SOTTOCORNOLA SPINELLI, Alessandro; R., Clerc; G., Ghibaudo
An improved formula for the determination of the polysilicon doping
2001-01-01 SOTTOCORNOLA SPINELLI, Alessandro; Pacelli, Andrea; Lacaita, ANDREA LEONARDO
Analysis of quantum yield in n-channel MOSFETs
2003-01-01 SOTTOCORNOLA SPINELLI, Alessandro; Ielmini, Daniele; Lacaita, ANDREA LEONARDO; A., Sebastiani; G., Ghidini
Analysis of space and Energy Distribution of Stress-Induced Oxide traps
1999-01-01 SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; D., Minelli; G., Ghidini
Analytical model for the electron-injection statistics during programming of nanoscale NAND Flash memories
2008-01-01 MONZIO COMPAGNONI, Christian; Gusmeroli, Riccardo; SOTTOCORNOLA SPINELLI, Alessandro; A., Visconti
Assessment of distributed-cycling schemes on 45nm NOR Flash memory arrays
2012-01-01 Miccoli, Carmine; MONZIO COMPAGNONI, Christian; L., Chiavarone; S., Beltrami; Lacaita, ANDREA LEONARDO; SOTTOCORNOLA SPINELLI, Alessandro; A., Visconti
Assessment of the statistical impedance field method for the analysis of the RTN amplitude in nanoscale MOS devices
2013-01-01 G., Torrente; Castellani, Niccolo'; A., Ghetti; MONZIO COMPAGNONI, Christian; Lacaita, ANDREA LEONARDO; SOTTOCORNOLA SPINELLI, Alessandro; A., Benvenuti