SOTTOCORNOLA SPINELLI, ALESSANDRO

SOTTOCORNOLA SPINELLI, ALESSANDRO  

DIPARTIMENTO DI ELETTRONICA, INFORMAZIONE E BIOINGEGNERIA  

Alessandro Spinelli; Alessandro S. Spinelli  

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Risultati 1 - 20 di 232 (tempo di esecuzione: 0.032 secondi).
Titolo Data di pubblicazione Autori File
2D QM simulation and optimization of decanano non-overlapped MOS devices 1-gen-2003 GUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDROPIROVANO, AGOSTINOLACAITA, ANDREA LEONARDO +
3D Monte Carlo simulation of the programming dynamics and their statistical variability in nanoscale charge-trap memories 1-gen-2010 AMOROSO, SALVATORE MARIAMACONI, ALESSANDROMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A comparative study of characterization techniques for oxide reliability in Flash memories 1-gen-2004 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A Multi-Channel Low-Power IC for Neural Spike Recording with Data Compression and Narrowband 400-MHz MC-FSK Wireless Transmission 1-gen-2010 BONFANTI, ANDREA GIOVANNIZAMBRA, GUIDOGUSMEROLI, RICCARDOBORGHI, TOMMASOSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A new two-trap tunneling model for the anomalous stress-induced leakage current (SILC) in Flash memories 1-gen-2001 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A recombination model for transient and stationary stress-induced leakage current 1-gen-2000 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A recombination- and trap-assisted tunneling model for stress-induced leakage current 1-gen-2001 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A statistical model for SILC in Flash memories 1-gen-2002 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A study of hot-hole injection during programming drain disturb in Flash memories 1-gen-2006 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDRO +
Accelerated reliability testing of Flash memory: accuracy and issues on a 45nm NOR technology 1-gen-2013 MICCOLI, CARMINEMONZIO COMPAGNONI, CHRISTIANLACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Accuracy and issues of the spectroscopic analysis of RTN traps in nanoscale MOSFETs 1-gen-2013 MONZIO COMPAGNONI, CHRISTIANAMOROSO, SALVATORE MARIACASTELLANI, NICCOLO'SOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Accurate Boundary Integral Calculation in Semiconductor Device Simulation 1-gen-2006 GUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDRO
Actively quenched single-photon avalanche diode for high repetition rate time-gated photon counting 1-gen-1996 SOTTOCORNOLA SPINELLI, ALESSANDRO +
An analytical model for flat-band polysilicon quantization in MOS devices 1-gen-2002 SOTTOCORNOLA SPINELLI, ALESSANDRO +
An improved formula for the determination of the polysilicon doping 1-gen-2001 SOTTOCORNOLA SPINELLI, ALESSANDROPACELLI, ANDREALACAITA, ANDREA LEONARDO
Analysis of quantum yield in n-channel MOSFETs 1-gen-2003 SOTTOCORNOLA SPINELLI, ALESSANDROIELMINI, DANIELELACAITA, ANDREA LEONARDO +
Analysis of space and Energy Distribution of Stress-Induced Oxide traps 1-gen-1999 SOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Analytical model for the electron-injection statistics during programming of nanoscale NAND Flash memories 1-gen-2008 MONZIO COMPAGNONI, CHRISTIANGUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Assessment of distributed-cycling schemes on 45nm NOR Flash memory arrays 1-gen-2012 MICCOLI, CARMINEMONZIO COMPAGNONI, CHRISTIANLACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Assessment of the statistical impedance field method for the analysis of the RTN amplitude in nanoscale MOS devices 1-gen-2013 CASTELLANI, NICCOLO'MONZIO COMPAGNONI, CHRISTIANLACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +