MONZIO COMPAGNONI, CHRISTIAN

MONZIO COMPAGNONI, CHRISTIAN  

DIPARTIMENTO DI ELETTRONICA, INFORMAZIONE E BIOINGEGNERIA  

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Risultati 1 - 20 di 56 (tempo di esecuzione: 0.057 secondi).
Titolo Data di pubblicazione Autori File
3D Monte Carlo simulation of the programming dynamics and their statistical variability in nanoscale charge-trap memories 1-gen-2010 AMOROSO, SALVATORE MARIAMACONI, ALESSANDROMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A Monte Carlo investigation of nanocrystal memory reliability 1-gen-2006 GUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDROMONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELELACAITA, ANDREA LEONARDO
A new channel percolation model for VT shift in discrete-trap memories 1-gen-2004 IELMINI, DANIELEMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A new erase saturation issue in cylindrical junction-less charge-trap memory arrays 1-gen-2012 MACONI, ALESSANDROMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO
A new physics-based model for TANOS memories program/erase 1-gen-2008 MONZIO COMPAGNONI, CHRISTIANMACONI, ALESSANDROSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A new spectral approach to modeling charge trapping/detrapping in NAND Flash memories 1-gen-2014 PAOLUCCI, GIOVANNI MARIAMONZIO COMPAGNONI, CHRISTIANMICCOLI, CARMINELACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
A single-electron analysis of NAND Flash memory programming 1-gen-2015 NICOSIA, GIANLUCAPAOLUCCI, GIOVANNI MARIAMONZIO COMPAGNONI, CHRISTIANRESNATI, DAVIDEMICCOLI, CARMINESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A Step Ahead Toward a New Microscopic Picture for Charge Trapping/detrapping in Flash Memories 1-gen-2016 RESNATI, DAVIDEMONZIO COMPAGNONI, CHRISTIANLACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Accelerated reliability testing of Flash memory: accuracy and issues on a 45nm NOR technology 1-gen-2013 MICCOLI, CARMINEMONZIO COMPAGNONI, CHRISTIANLACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Assessment of distributed-cycling schemes on 45nm NOR Flash memory arrays 1-gen-2012 MICCOLI, CARMINEMONZIO COMPAGNONI, CHRISTIANLACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Assessment of the statistical impedance field method for the analysis of the RTN amplitude in nanoscale MOS devices 1-gen-2013 CASTELLANI, NICCOLO'MONZIO COMPAGNONI, CHRISTIANLACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Current Transport in Polysilicon-channel GAA MOSFETs: A Modeling Perspective 1-gen-2019 A. MannaraA. Sottocornola SpinelliA. L. LacaitaC. Monzio Compagnoni
Cycling pattern and read/bake conditions dependence of random telegraph noise in decananometer NAND Flash arrays 1-gen-2015 MICCOLI, CARMINEPAOLUCCI, GIOVANNI MARIAMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDRO +
Cycling-induced threshold-voltage instabilities in nanoscale NAND Flash memories: sensitivity to the array background pattern 1-gen-2014 PAOLUCCI, GIOVANNI MARIAMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Data regeneration and disturb immunity of T-RAM cells 1-gen-2014 MULAOSMANOVIC, HALIDMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Defects spectroscopy in SiO2 by statistical random telegraph noise analysis 1-gen-2006 GUSMEROLI, RICCARDOMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Degradation dynamics for deep scaled p-MOSFET's during hot-carrier stress 1-gen-2002 MONZIO COMPAGNONI, CHRISTIANPIROVANO, AGOSTINOLACAITA, ANDREA LEONARDO
Depassivation of Traps in the Polysilicon Channel of 3D NAND Flash Arrays: Impact on Cell High-Temperature Data Retention 1-gen-2023 Mattia GiulianiniGerardo MalavenaAlessandro S. SpinelliChristian Monzio Compagnoni +
Doping engineering for random telegraph noise suppression in deca-nanometer Flash memories 1-gen-2011 AMOROSO, SALVATORE MARIAMONZIO COMPAGNONI, CHRISTIAN +
Evidence for an atomistic-doping induced variability of the band-to-band leakage current of nanoscale device junctions 1-gen-2012 MONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +