MONZIO COMPAGNONI, CHRISTIAN

MONZIO COMPAGNONI, CHRISTIAN  

DIPARTIMENTO DI ELETTRONICA, INFORMAZIONE E BIOINGEGNERIA  

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Risultati 1 - 20 di 61 (tempo di esecuzione: 0.014 secondi).
Titolo Data di pubblicazione Autori File
3D Monte Carlo simulation of the programming dynamics and their statistical variability in nanoscale charge-trap memories 1-gen-2010 AMOROSO, SALVATORE MARIAMACONI, ALESSANDROMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
3D Wide-Area TCAD Approach to Address Avalanche Breakdown in IGBT Edge Termination 1-gen-2025 M. GalvagnoG. MalavenaC. Monzio CompagnoniA. Sottocornola Spinelli +
A Monte Carlo investigation of nanocrystal memory reliability 1-gen-2006 GUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDROMONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELELACAITA, ANDREA LEONARDO
A new channel percolation model for VT shift in discrete-trap memories 1-gen-2004 IELMINI, DANIELEMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A new erase saturation issue in cylindrical junction-less charge-trap memory arrays 1-gen-2012 MACONI, ALESSANDROMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO
A new physics-based model for TANOS memories program/erase 1-gen-2008 MONZIO COMPAGNONI, CHRISTIANMACONI, ALESSANDROSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A new spectral approach to modeling charge trapping/detrapping in NAND Flash memories 1-gen-2014 PAOLUCCI, GIOVANNI MARIAMONZIO COMPAGNONI, CHRISTIANMICCOLI, CARMINELACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
A single-electron analysis of NAND Flash memory programming 1-gen-2015 NICOSIA, GIANLUCAPAOLUCCI, GIOVANNI MARIAMONZIO COMPAGNONI, CHRISTIANRESNATI, DAVIDEMICCOLI, CARMINESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A Step Ahead Toward a New Microscopic Picture for Charge Trapping/detrapping in Flash Memories 1-gen-2016 RESNATI, DAVIDEMONZIO COMPAGNONI, CHRISTIANLACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Accelerated reliability testing of Flash memory: accuracy and issues on a 45nm NOR technology 1-gen-2013 MICCOLI, CARMINEMONZIO COMPAGNONI, CHRISTIANLACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Assessment of distributed-cycling schemes on 45nm NOR Flash memory arrays 1-gen-2012 MICCOLI, CARMINEMONZIO COMPAGNONI, CHRISTIANLACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Assessment of the statistical impedance field method for the analysis of the RTN amplitude in nanoscale MOS devices 1-gen-2013 CASTELLANI, NICCOLO'MONZIO COMPAGNONI, CHRISTIANLACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Bio-Inspired Computing with Emerging Devices: Bridging 2D Materials and Neuromorphic Architectures 1-gen-2025 M. FarronatoP. MannocciA. MilozziC. Monzio CompagnoniD. Ielmini
Cryogenic Investigation of Vertical Charge Loss in 3D NAND Flash Memories 1-gen-2025 D. G. RefaldiG. MalavenaA. Sottocornola SpinelliC. Monzio Compagnoni +
Current Dynamics during Bipolar TDDB in Galvanic Isolators based on Polymeric Dielectrics 1-gen-2025 Greatti, M.Mazzola, J. L.Monzio Compagnoni, C.Sottocornola Spinelli, A.Malavena, G. +
Current Transport in Polysilicon-channel GAA MOSFETs: A Modeling Perspective 1-gen-2019 A. MannaraA. Sottocornola SpinelliA. L. LacaitaC. Monzio Compagnoni
Cycling pattern and read/bake conditions dependence of random telegraph noise in decananometer NAND Flash arrays 1-gen-2015 MICCOLI, CARMINEPAOLUCCI, GIOVANNI MARIAMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDRO +
Cycling-induced threshold-voltage instabilities in nanoscale NAND Flash memories: sensitivity to the array background pattern 1-gen-2014 PAOLUCCI, GIOVANNI MARIAMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Data regeneration and disturb immunity of T-RAM cells 1-gen-2014 MULAOSMANOVIC, HALIDMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Data science statistical approach to percolative conduction in Poly-Si based 3D NAND channels 1-gen-2025 D. G. RefaldiA. Sottocornola SpinelliC. Monzio Compagnoni +