MONZIO COMPAGNONI, CHRISTIAN
MONZIO COMPAGNONI, CHRISTIAN
DIPARTIMENTO DI ELETTRONICA, INFORMAZIONE E BIOINGEGNERIA
A comparison of modeling approaches for current transport in polysilicon‑channel nanowire and macaroni GAA MOSFETs
2021-01-01 Mannara, Aurelio; Malavena, Gerardo; SOTTOCORNOLA SPINELLI, Alessandro; MONZIO COMPAGNONI, Christian
A Noise-Resilient Neuromorphic Digit Classifier Based on NOR Flash Memories with Pulse-Width Modulation Scheme
2021-01-01 Malavena, G.; Sottocornola Spinelli, A.; Monzio Compagnoni, C.
A Semi-Analytical Model for Macaroni MOSFETs With Application to Vertical Flash Memories
2016-01-01 Paolucci, Giovanni M.; SOTTOCORNOLA SPINELLI, Alessandro; MONZIO COMPAGNONI, Christian; Tessariol, Paolo
Accuracy and issues of the spectroscopic analysis of RTN traps in nanoscale MOSFETs
2013-01-01 F., Adamu Lema; MONZIO COMPAGNONI, Christian; Amoroso, SALVATORE MARIA; Castellani, Niccolo'; L., Gerrer; S., Markov; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; A., Asenov
Analytical model for the electron-injection statistics during programming of nanoscale NAND Flash memories
2008-01-01 MONZIO COMPAGNONI, Christian; Gusmeroli, Riccardo; SOTTOCORNOLA SPINELLI, Alessandro; A., Visconti
Characterization and Modeling of Current Transport in Metal/Ferroelectric/Semiconductor Tunnel Junctions
2020-01-01 Franchini, G.; Sottocornola Spinelli, A.; Nicosia, G.; Fumagalli, I.; Asa, M.; Groppi, C.; Rinaldi, C.; Lacaita, A. L.; Bertacco, R.; Monzio Compagnoni, C.
Characterization and modeling of temperature effects in 3-D NAND Flash arrays - Part I: Polysilicon-induced variability
2018-01-01 Resnati, Davide; Mannara, Aurelio; Nicosia, Gianluca; Paolucci, Giovanni M.; Tessariol, Paolo; Spinelli, Alessandro S.; Lacaita, Andrea L.; MONZIO COMPAGNONI, Christian
Characterization and modeling of temperature effects in 3-D NAND Flash arrays - Part II: Random telegraph noise
2018-01-01 Nicosia, G.; Mannara, A.; Resnati, D.; Paolucci, G. M.; Tessariol, P.; Spinelli, A. S.; Lacaita, A. L.; Goda, A.; Monzio Compagnoni, C.
Characterization and modeling of the band-to-band current variability of nanoscale device junctions
2013-01-01 A., Ghetti; MONZIO COMPAGNONI, Christian; A., Calloni; L., Vendrame; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO
Characterization of transient currents in HfO2 capacitors in the short timescale
2006-01-01 MONZIO COMPAGNONI, Christian; SOTTOCORNOLA SPINELLI, Alessandro; A., Bianchini; Lacaita, ANDREA LEONARDO; S., Spiga; M., Fanciulli
Charge retention phenomena in charge transfer silicon nitride: impact of technology and operating conditions
2011-01-01 G., Ghidini; N., Galbiati; E., Mascellino; C., Scozzari; A., Sebastiani; Amoroso, SALVATORE MARIA; MONZIO COMPAGNONI, Christian; SOTTOCORNOLA SPINELLI, Alessandro; Maconi, Alessandro; R., Piagge; A., Del Vitto; M., Alessandri; I., Baldi; E., Moltrasio; G., Albini; A., Grossi; P., Tessariol; E., Camerlenghi; A., Mauri
Comments on "A general and transformable model platform for emerging multi-gate MOSFETs"
2017-01-01 Paolucci, Giovanni M.; SOTTOCORNOLA SPINELLI, Alessandro; MONZIO COMPAGNONI, Christian; Paolo, Tessariol
Compact modeling of GIDL-assisted erase in 3-D NAND Flash strings
2019-01-01 Malavena, G.; Mannara, A.; Lacaita, A. L.; Sottocornola Spinelli, A.; Monzio Compagnoni, C.
Compact modeling of variability effects in nanoscale NAND Flash memories
2011-01-01 A., Spessot; MONZIO COMPAGNONI, Christian; F., Farina; A., Calderoni; SOTTOCORNOLA SPINELLI, Alessandro; P., Fantini
Comparison of modeling approaches for the capacitance-voltage and current-voltage characteristics of advanced gate stacks
2007-01-01 P., Palestri; N., Barin; D., Brunel; C., Busseret; A., Campera; P. A., Childs; F., Driussi; C., Fiegna; G., Fiori; Gusmeroli, Riccardo; G., Iannaccone; M., Karner; H., Kosina; Lacaita, ANDREA LEONARDO; E., Langer; B., Majkusiak; MONZIO COMPAGNONI, Christian; A., Poncet; E., Sangiorgi; L., Selmi; SOTTOCORNOLA SPINELLI, Alessandro; J., Walczak
Comprehensive analysis of random telegraph noise instability and its scaling in deca-nanometer Flash memories
2009-01-01 A., Ghetti; MONZIO COMPAGNONI, Christian; SOTTOCORNOLA SPINELLI, Alessandro; A., Visconti
Comprehensive investigation of statistical effects in nitride memories - Part I: Physics-based modeling
2010-01-01 A., Mauri; MONZIO COMPAGNONI, Christian; Amoroso, SALVATORE MARIA; Maconi, Alessandro; A., Ghetti; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO
Comprehensive investigation of statistical effects in nitride memories - Part II: Scaling analysis and impact on device performance
2010-01-01 MONZIO COMPAGNONI, Christian; A., Mauri; Amoroso, SALVATORE MARIA; Maconi, Alessandro; E., Greco; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO
Comprehensive investigation of the impact of lateral charge migration on retention performance of planar and 3D SONOS devices
2012-01-01 Maconi, Alessandro; A., Arreghini; MONZIO COMPAGNONI, Christian; G., Van den bosch; SOTTOCORNOLA SPINELLI, Alessandro; J., Van Houdt; Lacaita, ANDREA LEONARDO
Comprehensive numerical simulation of threshold-voltage transients in nitride memories
2011-01-01 A., Mauri; Amoroso, SALVATORE MARIA; MONZIO COMPAGNONI, Christian; Maconi, Alessandro; SOTTOCORNOLA SPINELLI, Alessandro