REFALDI, DAVID GIANLUIGI
REFALDI, DAVID GIANLUIGI
DIPARTIMENTO DI ELETTRONICA, INFORMAZIONE E BIOINGEGNERIA
Discrete-Trap Effects on 3-D NAND Variability – Part I: Threshold Voltage
2024-01-01 Malavena, Gerardo; Amoroso, SALVATORE M.; Brown, ANDREW R.; Asenov, Plamen; Lin, XI-WEI; Moroz, Victor; Giulianini, Mattia; Refaldi, DAVID G.; MONZIO COMPAGNONI, Christian; SOTTOCORNOLA SPINELLI, Alessandro
Discrete-Trap Effects on 3-D NAND Variability – Part II: Random Telegraph Noise
2024-01-01 Malavena, Gerardo; Amoroso, SALVATORE M.; Brown, ANDREW R.; Asenov, Plamen; Lin, XI-WEI; Moroz, Victor; Giulianini, Mattia; Refaldi, DAVID G.; MONZIO COMPAGNONI, Christian; SOTTOCORNOLA SPINELLI, Alessandro
Evidence of Widely Distributed Time Constants in the Vertical Charge Loss of 3-D Charge-Trap NAND Flash Memories
2024-01-01 Refaldi, David G.; Malavena, Gerardo; Chiavarone, Luca; SOTTOCORNOLA SPINELLI, Alessandro; MONZIO COMPAGNONI, Christian
First Evidence of SET-Like Behavior of 3-D NAND Flash Cells in the Deep-Cryogenic Regime
2024-01-01 Refaldi, David G.; Malavena, Gerardo; Giulianini, Mattia; Chiavarone, Luca; SOTTOCORNOLA SPINELLI, Alessandro; MONZIO COMPAGNONI, Christian
Origin of the Temperature Dependence of Gate-Induced Drain Leakage-Assisted Erase in Three-Dimensional NAND Flash Memories
2024-01-01 Refaldi, David G.; Malavena, Gerardo; Chiavarone, Luca; SOTTOCORNOLA SPINELLI, Alessandro; MONZIO COMPAGNONI, Christian
Understanding the impact of polysilicon percolative conduction on 3D NAND variability
2023-01-01 Amoroso, S. M.; Malavena, G.; Brown, A. R.; Asenov, P.; Lin, X. -W.; Moroz, V.; Giulianini, M.; Refaldi, D. G.; Monzio Compagnoni, C.; Sottocornola Spinelli, A.