MONZIO COMPAGNONI, CHRISTIAN

MONZIO COMPAGNONI, CHRISTIAN  

DIPARTIMENTO DI ELETTRONICA, INFORMAZIONE E BIOINGEGNERIA  

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Risultati 1 - 20 di 156 (tempo di esecuzione: 0.055 secondi).
Titolo Data di pubblicazione Autori File
3D Monte Carlo simulation of the programming dynamics and their statistical variability in nanoscale charge-trap memories 1-gen-2010 AMOROSO, SALVATORE MARIAMACONI, ALESSANDROMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A comparison of modeling approaches for current transport in polysilicon‑channel nanowire and macaroni GAA MOSFETs 1-gen-2021 Aurelio MannaraGerardo MalavenaAlessandro Sottocornola SpinelliChristian Monzio Compagnoni
A Monte Carlo investigation of nanocrystal memory reliability 1-gen-2006 GUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDROMONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELELACAITA, ANDREA LEONARDO
A new channel percolation model for VT shift in discrete-trap memories 1-gen-2004 IELMINI, DANIELEMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A new erase saturation issue in cylindrical junction-less charge-trap memory arrays 1-gen-2012 MACONI, ALESSANDROMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO
A new physics-based model for TANOS memories program/erase 1-gen-2008 MONZIO COMPAGNONI, CHRISTIANMACONI, ALESSANDROSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A new spectral approach to modeling charge trapping/detrapping in NAND Flash memories 1-gen-2014 PAOLUCCI, GIOVANNI MARIAMONZIO COMPAGNONI, CHRISTIANMICCOLI, CARMINELACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
A Noise-Resilient Neuromorphic Digit Classifier Based on NOR Flash Memories with Pulse-Width Modulation Scheme 1-gen-2021 G. MalavenaA. Sottocornola SpinelliC. Monzio Compagnoni
A Semi-Analytical Model for Macaroni MOSFETs With Application to Vertical Flash Memories 1-gen-2016 SOTTOCORNOLA SPINELLI, ALESSANDROMONZIO COMPAGNONI, CHRISTIAN +
A single-electron analysis of NAND Flash memory programming 1-gen-2015 NICOSIA, GIANLUCAPAOLUCCI, GIOVANNI MARIAMONZIO COMPAGNONI, CHRISTIANRESNATI, DAVIDEMICCOLI, CARMINESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A Step Ahead Toward a New Microscopic Picture for Charge Trapping/detrapping in Flash Memories 1-gen-2016 RESNATI, DAVIDEMONZIO COMPAGNONI, CHRISTIANLACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Accelerated reliability testing of Flash memory: accuracy and issues on a 45nm NOR technology 1-gen-2013 MICCOLI, CARMINEMONZIO COMPAGNONI, CHRISTIANLACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Accuracy and issues of the spectroscopic analysis of RTN traps in nanoscale MOSFETs 1-gen-2013 MONZIO COMPAGNONI, CHRISTIANAMOROSO, SALVATORE MARIACASTELLANI, NICCOLO'SOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Analysis of High-Temperature Data Retention in 3D Floating-Gate NAND Flash Memory Arrays 1-gen-2023 GERARDO MALAVENAMATTIA GIULIANINIALESSANDRO Sottocornola SPINELLICHRISTIAN MONZIO COMPAGNONI +
Analytical model for the electron-injection statistics during programming of nanoscale NAND Flash memories 1-gen-2008 MONZIO COMPAGNONI, CHRISTIANGUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Assessment of distributed-cycling schemes on 45nm NOR Flash memory arrays 1-gen-2012 MICCOLI, CARMINEMONZIO COMPAGNONI, CHRISTIANLACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Assessment of the statistical impedance field method for the analysis of the RTN amplitude in nanoscale MOS devices 1-gen-2013 CASTELLANI, NICCOLO'MONZIO COMPAGNONI, CHRISTIANLACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Characterization and Modeling of Current Transport in Metal/Ferroelectric/Semiconductor Tunnel Junctions 1-gen-2020 G. FranchiniA. Sottocornola SpinelliG. NicosiaM. AsaC. GroppiC. RinaldiA. L. LacaitaR. BertaccoC. Monzio Compagnoni +
Characterization and modeling of temperature effects in 3-D NAND Flash arrays - Part I: Polysilicon-induced variability 1-gen-2018 Davide ResnatiAurelio MannaraGianluca NicosiaAlessandro S. SpinelliAndrea L. LacaitaChristian Monzio Compagnoni +
Characterization and modeling of temperature effects in 3-D NAND Flash arrays - Part II: Random telegraph noise 1-gen-2018 G. NicosiaA. MannaraD. ResnatiA. S. SpinelliA. L. LacaitaC. Monzio Compagnoni +