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Mostrati risultati da 1 a 20 di 142
Titolo Data di pubblicazione Autore(i) File
Degradation dynamics for deep scaled p-MOSFET's during hot-carrier stress 1-gen-2002 MONZIO COMPAGNONI, CHRISTIANPIROVANO, AGOSTINOLACAITA, ANDREA LEONARDO
How far will Silicon nanocrystals push the scaling limits of NVMs technologies? 1-gen-2003 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Program/erase dynamics and channel conduction in nanocrystal memories 1-gen-2003 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Study of data retention for nanocrystal Flash memories 1-gen-2003 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDOPREVITALI, CRISTIAN +
Improving floating-gate memory reliability by nanocrystal storage and pulsed tunnel programming 1-gen-2004 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A new channel percolation model for VT shift in discrete-trap memories 1-gen-2004 IELMINI, DANIELEMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Study of nanocrystal memory reliability by CAST structures 1-gen-2004 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Statistical analysis of nanocrystal memory reliability 1-gen-2004 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Reliability assessment of discrete-trap memories for NOR applications 1-gen-2005 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDOSOTGIU, RICCARDO
Optimization of threshold voltage window under tunneling program/erase in nanocrystal memories 1-gen-2005 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO
Edge and percolation effects on VT window in nanocrystal memories 1-gen-2005 GUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDROMONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELELACAITA, ANDREA LEONARDO
Program and SILC constraints on NC memories scaling: a Monte Carlo approach 1-gen-2005 GUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDROMONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELELACAITA, ANDREA LEONARDO +
Modeling of tunneling P/E for nanocrystal memories 1-gen-2005 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO
Defects spectroscopy in SiO2 by statistical random telegraph noise analysis 1-gen-2006 GUSMEROLI, RICCARDOMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Temperature dependence of transient and steady-state gate currents in HfO2 capacitors 1-gen-2006 MONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Extraction of the floating-gate capacitive couplings for drain turn-on estimation in discrete-trap memories 1-gen-2006 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO
Transient currents in HfO2 and their impact on circuit and memory applications 1-gen-2006 MONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Characterization of transient currents in HfO2 capacitors in the short timescale 1-gen-2006 MONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Threshold-voltage statistics and conduction regimes in nanocrystal memories 1-gen-2006 GUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDROMONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELE
A Monte Carlo investigation of nanocrystal memory reliability 1-gen-2006 GUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDROMONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELELACAITA, ANDREA LEONARDO
Mostrati risultati da 1 a 20 di 142
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