TAGLIAFERRI, ALBERTO
20 nm-Resolved Stress Profile in SiGe Nano-Stripes Obtained by Tip-Enhanced Raman Spectroscopy
2015-01-01 Chaigneau, Marc; Vanacore, Giovannimaria; Bollani, Monica; Picardi, Gennaro; Tagliaferri, Alberto; Ossikovski, Razvigor
3D characterization at the nanoscale by stereoscopic scanning electron microscopy
2015-01-01 Sala, Vittorio; Bollani, Monica; Pietralunga, SILVIA MARIA; Zani, Maurizio; Tagliaferri, Alberto
A determination of the pairing interaction in the high Tc cuprate superconductor Tl2Ba2CaCu2O8 (Tl2212)
2007-01-01 W. A., Little; M. J., Holcomb; Ghiringhelli, GIACOMO CLAUDIO; Braicovich, Lucio; Dallera, Claudia; Piazzalunga, Andrea; Tagliaferri, Alberto; N. B., Brookes
A method of surface texturization of silicon by a maskless plasma process
2015-01-01 Monteleone, G.; Vassallo, E.; Caniello, R.; Cremona, A.; Ghezzi, F.; Inzoli, Federica; Laguardia, L.; Pallotta, F.; Pedroni, M.; Spampinato, V.; Pietralunga, S. M.; Zani, Maurizio; Tagliaferri, Alberto; DI FONZO, Fabio; Nava, Giorgio
A simple spherical grating by-pass monochromator dedicated to soft x-ray emission spectroscopy
1998-01-01 Ghiringhelli, GIACOMO CLAUDIO; Tagliaferri, Alberto; Braicovich, Lucio; Brookes, N. B.
Advanced Spectroscopies of Graphene and 2D Materials
2016-01-01 Pietralunga, SILVIA MARIA; Manzoni, Cristian; Carpene, Ettore; Bugini, Davide; DAL CONTE, Stefano; HEDAYAT ZADEH ROODSARI, Hamoon; Soavi, Giancarlo; VAHID DASTJERDI, MOHAMMAD JAVAD; Virgili, Tersilla; Zani, Maurizio; Dallera, Claudia; Sordan, Roman; Tagliaferri, Alberto; Cerullo, GIULIO NICOLA
alpha-gamma transition in metallic Ce studied by resonant x-ray spectroscopies
2004-01-01 Dallera, Claudia; M., Grioni; A., Palenzona; M., Taguchi; E., Annese; Ghiringhelli, GIACOMO CLAUDIO; Tagliaferri, Alberto; N. B., Brookes; T. H., Neisius; Braicovich, Lucio
Amorphous WO3 as transparent conductive oxide in the near-IR
2022-01-01 Chen, Hao; Carlotto, Alice; Armellini, Cristina; Cassinelli, Marco; Caironi, Mario; Zaghloul, Mohamed; Tagliaferri, Alberto; Chiasera, Alessandro; Pietralunga, Silvia M.
Black-silicon production process by CF4/H2 plasma
2016-01-01 Vassallo, E.; Pedroni, M.; Pietralunga, SILVIA MARIA; Caniello, R.; Cremona, A.; DI FONZO, Fabio; Ghezzi, F.; Inzoli, Federica; Monteleone, G.; Nava, Giorgio; Spampinato, V.; Tagliaferri, Alberto; Zani, Maurizio; Angella, Giuliano
Charge carrier dynamics at doped silicon surface by ultrafast scanning electron microscopy
2017-01-01 Sala, Vittorio; Pietralunga, SILVIA MARIA; Zani, Maurizio; Irde, Gabriele; Manzoni, Cristian; Isella, Giovanni; Cerullo, GIULIO NICOLA; Lanzani, Guglielmo; Tagliaferri, Alberto
Charge carrier dynamics by secondary electron detection in ultrafast scanning electron microscopy
2017-01-01 Sala, Vittorio; Pietralunga, SILVIA MARIA; Zani, Maurizio; Irde, Gabriele; Manzoni, Cristian; Isella, Giovanni; Cerullo, GIULIO NICOLA; Lanzani, Guglielmo; Tagliaferri, Alberto
Charge dynamics in aluminum oxide thin film revealed by ultrafast scanning electron microscopy
2017-01-01 Sala, Vittorio; Zani, Maurizio; Irde, Gabriele; Pietralunga, SILVIA MARIA; Cerullo, GIULIO NICOLA; Lanzani, Guglielmo; Tagliaferri, Alberto
Charge dynamics in aluminum oxide thin film studied by ultrafast scanning electron microscopy
2018-01-01 Zani, Maurizio; Sala, Vittorio; Irde, Gabriele; Pietralunga, SILVIA MARIA; Manzoni, Cristian; Cerullo, GIULIO NICOLA FELICE; Lanzani, Guglielmo; Tagliaferri, Alberto
Charge-transfer excitations in lanthanum compounds measured by resonant inelastic x-ray scattering at the M5 edge
2001-01-01 Dallera, C.; Giarda, Katia; Ghiringhelli, G.; Tagliaferri, A.; Braicovich, L.; Brookes, N.
Co-L2,3 resonant x-ray scattering in magnetic CoFe2O4 in the perpendicular geometry: experimental and theoretical results on circular dichroism
2004-01-01 M., Taguchi; Braicovich, Lucio; E., Annese; Dallera, Claudia; Ghiringhelli, GIACOMO CLAUDIO; Tagliaferri, Alberto; N. B., Brookes
Coherent, high repetition rate tender x-ray free-electron laser seeded by an extreme ultra-violet free-electron laser oscillator
2020-01-01 Petrillo, V; Opromolla, M; Bacci, A; Broggi, F; Drebot, I; Ghiringhelli, G; Puppin, E; Rossetti Conti, M; R Rossi, A; Ruijter, M; Samsam, S; Tagliaferri, A; Rossi, G; Serafini, L
Combining M- and L-edge resonant inelastic x-ray scattering for studies of 3d transition metal compounds
2008-01-01 S. G., Chiuzbaian; T., Schmitt; M., Matsubara; A., Kotani; Ghiringhelli, GIACOMO CLAUDIO; Dallera, Claudia; Tagliaferri, Alberto; Braicovich, Lucio; V., Scagnoli; N. B., Brookes; U., Staub; L., Patthey
Competition between resonant Raman scattering and fluorescence at the L3 -edges with final 3s hole in CoO and NiO
1999-01-01 Borgatti, F; Braicovich, Lucio; Brookes, N. B.; Ghiringhelli, GIACOMO CLAUDIO; Tagliaferri, Alberto
Configuration interaction in L2,3 edge resonant inelastic X-ray scattering spectra of CaF2 and ScAl2
2003-01-01 Dallera, Claudia; M., Taguchi; C. F., Hague; L., Journel; M., Sacchi; A., Palenzona; Braicovich, Lucio; Ghiringhelli, GIACOMO CLAUDIO; Tagliaferri, Alberto; A., Palenzona; N. B., Brookes
Covalency in the uranyl ion: A polarized x-ray spectroscopic study
2002-01-01 Denning, R. G.; Green, J. C.; Hutchings, T. E.; Dallera, Claudia; Tagliaferri, Alberto; Giarda, K.; Brookes, N. B.; Braicovich, Lucio