ZAGHLOUL, MOHAMED ZAGHLOUL HASSAN ABDELSALAM
ZAGHLOUL, MOHAMED ZAGHLOUL HASSAN ABDELSALAM
DIPARTIMENTO DI FISICA
Amorphous WO3 as transparent conductive oxide in the near-IR
2022-01-01 Chen, Hao; Carlotto, Alice; Armellini, Cristina; Cassinelli, Marco; Caironi, Mario; Zaghloul, Mohamed; Tagliaferri, Alberto; Chiasera, Alessandro; Pietralunga, Silvia M.
Dynamical imaging of local photovoltage at semiconductor surface by photo-assisted ultrafast scanning electron microscopy
2021-01-01 Zaghloul, Mohamed; Pietralunga, Silvia M.; Irde, Gabriele; Sala, Vittorio; Cerullo, GIULIO NICOLA FELICE; Chen, Hao; Isella, Giovanni; Lanzani, Guglielmo; Zani, Maurizio; Tagliaferri, Alberto
IM1-O-3 Perspectives of ultrafast hyperspectral imaging in Scanning Electron Microscopy
2025-01-01 Tagliaferri, Alberto; Kosari Mehr, Abbas; Afshar, Erfan; Khan, Madiha; Ritik, Ritik; Zaghloul, Mohamed; Cao, Wenzheng; Khursheed, Anjam; Pietralunga, Silvia Maria
IM1-P-7 Quantum state secondary electron emission spectroscopy in low voltage scanning electron microscope for probing Valence band
2025-01-01 Kosari Mehr, Abbas; Zaghloul, Mohamed; Ritik, Ritik; Cao, Wenzheng; Khan, Madiha; Afshar, Erfan; Pietralunga, Silvia Maria; Khursheed, Anjam; Tagliaferri, Alberto
Imaging MEMS motion at nano scale by time-resolved scanning electron microscopy
2023-01-01 Zaghloul, Mohamed; Kosari Mehr, Abbas; Bertacco, Riccardo; Cuccurullo, Simone; Maspero, Federico; Pavese, Giulia; Chen, Hao; Ghisi, Aldo; Corigliano, Alberto; Pietralunga, Silvia Maria; Tagliaferri, Alberto
Imaging MEMS motion at nano scale by time-resolved scanning electron microscopy
2024-01-01 Zaghloul, Mohamed; Kosari Mehr, Abbas; Bertacco, Riccardo; Cuccurullo, Simone; Maspero, Federico; Pavese, Giulia; Chen, Hao; Ghisi, Aldo; Corigliano, Alberto; Pietralunga, Silvia Maria; Tagliaferri, Alberto
Near-IR transparent conductive amorphous tungsten oxide thin layers by non-reactive radio-frequency magnetron sputtering
2021-01-01 Chen, Hao; Chiasera, Alessandro; Armellini, Cristina; Speranza, Giorgio; Varas, Stefano; Sayginer, Osman; Alfano, Antonio; Cassinelli, Marco; Caironi, Mario; Suriano, Raffaella; Zaghloul, Mohamed; Tagliaferri, Alberto; Ferrari, Maurizio; Pietralunga, Silvia M.
Perspectives of ultrafast hyperspectral imaging in Scanning Electron Microscopy
2023-01-01 Tagliaferri, Alberto; KOSARI MEHR, Abbas; Zaghloul, Mohamed; Cao, Wenzheng; Chen, Hao; Irde, Gabriele; Sala, Vittorio; Cerullo, Giulio; Isella, Giovanni; Lanzani, Guglielmo; Zani, Maurizio; Khursheed, Anjam; Pietralunga, Silvia
Perspectives of ultrafast hyperspectral imaging in Scanning Electron Microscopy
2025-01-01 Tagliaferri, Alberto; Kosari Mehr, Abbas; Khan, Madiha; Ritik, Ritik; Zaghloul, Mohamed; Cao, Wenzheng; Khursheed, Anjam; Pietralunga, Silvia Maria
Surface and defect analysis in advanced materials: leveraging EBIC and SEES in SEM
2024-01-01 Ritik, Ritik; Kosari Mehr, Abbas; Zaghloul, Mohamed; Cao, Wenzheng; Khursheed, Anjam; Pietralunga, Silvia Maria; Tagliaferri, Alberto
Surface-sensitive secondary electron emission spectroscopy in low voltage scanning electron microscope for Valence Band analysis
2025-01-01 Kosari Mehr, Abbas; Zaghloul, Mohamed; Cao, Wenzheng; Afshar, Erfan; Pietralunga, Silvia Maria; Khursheed, Anjam; Tagliaferri, Alberto