IELMINI, DANIELE

IELMINI, DANIELE  

DIPARTIMENTO DI ELETTRONICA, INFORMAZIONE E BIOINGEGNERIA  

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Titolo Data di pubblicazione Autori File
(Invited) Resistive Switching in Metal Oxides: From Physical Modeling to Device Scaling 1-gen-2013 IELMINI, DANIELEAMBROGIO, STEFANO +
Analogue In-Memory Computing with Resistive Switching Memories 1-gen-2022 Pedretti, GiacomoIelmini, Daniele
Applications of Resistive Switching Memory as Hardware Security Primitive 1-gen-2020 Carboni R.Ielmini D.
Brain-Inspired Memristive Neural Networks for Unsupervised Learning 1-gen-2019 Ielmini, DanieleMilo, Valerio
Computing with nonvolatile memories for artificial intelligence 1-gen-2022 Pedretti, GiacomoIelmini, Daniele
Development of Crosspoint Memory Arrays for Neuromorphic Computing 1-gen-2024 Ricci, SaverioMannocci, PiergiulioFarronato, MatteoMilozzi, AlessandroIelmini, Daniele
Drift Phenomena in Phase Change Memories 1-gen-2021 Ielmini, Daniele
Electrical transport in crystalline and amorphous chalcogenide 1-gen-2017 Ielmini, Daniele
Introduction to Nanoionic Elements for Information Technology,” in Resistive switching – from fundamental redox-processes to device applications 1-gen-2016 IELMINI, DANIELE +
Memristive/CMOS devices for neuromorphic applications 1-gen-2023 V. MiloG. MalavenaC. Monzio CompagnoniD. Ielmini
Neuromorphic computing with resistive switching memory devices 1-gen-2019 Ielmini, DanieleAmbrogio, Stefano
Phase change memory device modeling 1-gen-2009 IELMINI, DANIELE
Phase Change Memory Physics-Based Modeling: Electrical Characteristics, Scaling, and Reliability 1-gen-2012 IELMINI, DANIELE
Present status and scaling challenges for the NOR Flash memory technology 1-gen-2009 MONZIO COMPAGNONI, CHRISTIANGUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDROIELMINI, DANIELELACAITA, ANDREA LEONARDO +
Resistive switching memories 1-gen-2014 IELMINI, DANIELE
Resistive Switching Models by Ion Migration in Metal Oxides 1-gen-2013 IELMINI, DANIELE
Resistive-Switching Memory Devices Based on Metal Oxides: Modeling of Unipolar Switching, Reliability, and Scaling 1-gen-2012 CAGLI, CARLOIELMINI, DANIELE
Stress-induced asymmetric switching and filament instability in electrochemical memories 1-gen-2014 IELMINI, DANIELEAMBROGIO, STEFANOBALATTI, SIMONE
Structure and properties of sputter-deposited BN thin films. 1-gen-1996 IELMINI, DANIELEOSSI, PAOLO MARIA +
Synaptic realizations based on memristive devices 1-gen-2020 Milo, ValerioIelmini, Daniele +