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Titolo Data di pubblicazione Autori File
Modeling of anomalous SILC in Flash memories based on tunneling at multiple defects 1-gen-2002 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Statistical profiling of SILC spot in Flash memories 1-gen-2002 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Localization of SILC in Flash memories after program/erase cycling 1-gen-2002 IELMINI, DANIELELACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Equivalent cell approach for extraction of the SILC distribution in Flash EEPROM cells 1-gen-2002 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Drain-accelerated degradation of tunnel oxides in Flash memories 1-gen-2002 IELMINI, DANIELELACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Modeling of stress-induced leakage current and impact ionization in MOS devices 1-gen-2002 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Correlated defect generation in thin oxides and its impact on Flash reliability 1-gen-2002 IELMINI, DANIELELACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
A statistical model for SILC in Flash memories 1-gen-2002 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Experimental and Monte Carlo analysis of drain-avalanche hot-hole injection for reliability optimization in Flash memories 1-gen-2003 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Impact of gate stack process on conduction and reliability of 0.18um PMOSFET 1-gen-2003 IELMINI, DANIELE +
Program/erase dynamics and channel conduction in nanocrystal memories 1-gen-2003 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
How far will Silicon nanocrystals push the scaling limits of NVMs technologies? 1-gen-2003 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Study of data retention for nanocrystal Flash memories 1-gen-2003 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDOPREVITALI, CRISTIAN +
Analysis of quantum yield in n-channel MOSFETs 1-gen-2003 SOTTOCORNOLA SPINELLI, ALESSANDROIELMINI, DANIELELACAITA, ANDREA LEONARDO +
Programming and disturb characteristics in nonvolatile phase-change memories 1-gen-2004 LACAITA, ANDREA LEONARDOIELMINI, DANIELE +
Reliability study of phase-change non-volatile memories. 1-gen-2004 PIROVANO, AGOSTINOREDAELLI, ANDREAIELMINI, DANIELELACAITA, ANDREA LEONARDO +
Analysis of phase-transformation dynamics and estimation of amorphous-chalcogenide fraction in phase-change memories 1-gen-2004 IELMINI, DANIELELACAITA, ANDREA LEONARDO +
A comparative study of characterization techniques for oxide reliability in Flash memories 1-gen-2004 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Impact of correlated generation of oxide defects on SILC and breakdown distributions 1-gen-2004 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Study of nanocrystal memory reliability by CAST structures 1-gen-2004 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Mostrati risultati da 21 a 40 di 430
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