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Titolo Data di pubblicazione Autori File
An improved formula for the determination of the polysilicon doping 1-gen-2001 SOTTOCORNOLA SPINELLI, ALESSANDROPACELLI, ANDREALACAITA, ANDREA LEONARDO
Monitoring Flash EEPROM reliability by equivalent cell analysis. 1-gen-2002 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A statistical model for SILC in Flash memories 1-gen-2002 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
An analytical model for flat-band polysilicon quantization in MOS devices 1-gen-2002 SOTTOCORNOLA SPINELLI, ALESSANDRO +
Theory of direct-tunneling current in metal-oxide-semiconductor structures 1-gen-2002 SOTTOCORNOLA SPINELLI, ALESSANDRO +
Modeling of stress-induced leakage current and impact ionization in MOS devices 1-gen-2002 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Statistical profiling of SILC spot in Flash memories 1-gen-2002 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Two-dimensional quantum effects in nanoscale MOSFETs 1-gen-2002 PIROVANO, AGOSTINOLACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO
Simulation of polysilicon quantization and its effect on n-and p-MOSFET performance 1-gen-2002 SOTTOCORNOLA SPINELLI, ALESSANDROPACELLI, ANDREALACAITA, ANDREA LEONARDO
Modeling of anomalous SILC in Flash memories based on tunneling at multiple defects 1-gen-2002 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Equivalent cell approach for extraction of the SILC distribution in Flash EEPROM cells 1-gen-2002 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Correlated defect generation in thin oxides and its impact on Flash reliability 1-gen-2002 IELMINI, DANIELELACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Drain-accelerated degradation of tunnel oxides in Flash memories 1-gen-2002 IELMINI, DANIELELACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Localization of SILC in Flash memories after program/erase cycling 1-gen-2002 IELMINI, DANIELELACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Post-breakdown characterization in thin gate oxides 1-gen-2002 SOTTOCORNOLA SPINELLI, ALESSANDRO +
Study of data retention for nanocrystal Flash memories 1-gen-2003 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDOPREVITALI, CRISTIAN +
Laser-based calibration for the HARP time of flight system 1-gen-2003 SOTTOCORNOLA SPINELLI, ALESSANDRO +
Program/erase dynamics and channel conduction in nanocrystal memories 1-gen-2003 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
The laser calibration system of the HARP TOF 1-gen-2003 SOTTOCORNOLA SPINELLI, ALESSANDRO +
How far will Silicon nanocrystals push the scaling limits of NVMs technologies? 1-gen-2003 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Mostrati risultati da 41 a 60 di 238
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