Sfoglia per Autore
Electrical characterization and quantum modeling of MOS capacitors with ultra-thin oxides (1.4-3nm)
2001-01-01 R., Clerc; SOTTOCORNOLA SPINELLI, Alessandro; G., Ghibaudo; C., Leroux; G., Pananakakis
Monitoring Flash EEPROM reliability by equivalent cell analysis.
2002-01-01 Ielmini, Daniele; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; M., Gubello; M., VAN DUUREN
Post-breakdown characterization in thin gate oxides
2002-01-01 E., Vigano; A., Ghetti; G., Ghidini; SOTTOCORNOLA SPINELLI, Alessandro
Localization of SILC in Flash memories after program/erase cycling
2002-01-01 Ielmini, Daniele; Lacaita, ANDREA LEONARDO; R., Leone; A., Modelli; SOTTOCORNOLA SPINELLI, Alessandro
Drain-accelerated degradation of tunnel oxides in Flash memories
2002-01-01 A., Chimenton; Ielmini, Daniele; Lacaita, ANDREA LEONARDO; P., Olivo; SOTTOCORNOLA SPINELLI, Alessandro; A., Visconti
Correlated defect generation in thin oxides and its impact on Flash reliability
2002-01-01 Ielmini, Daniele; Lacaita, ANDREA LEONARDO; SOTTOCORNOLA SPINELLI, Alessandro; M., Van Duuren
Equivalent cell approach for extraction of the SILC distribution in Flash EEPROM cells
2002-01-01 Ielmini, Daniele; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; A., Modelli
Modeling of stress-induced leakage current and impact ionization in MOS devices
2002-01-01 Ielmini, Daniele; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; G., Ghidini
Simulation of polysilicon quantization and its effect on n-and p-MOSFET performance
2002-01-01 SOTTOCORNOLA SPINELLI, Alessandro; Pacelli, Andrea; Lacaita, ANDREA LEONARDO
Statistical profiling of SILC spot in Flash memories
2002-01-01 Ielmini, Daniele; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; A., Visconti
Two-dimensional quantum effects in nanoscale MOSFETs
2002-01-01 Pirovano, Agostino; Lacaita, ANDREA LEONARDO; SOTTOCORNOLA SPINELLI, Alessandro
Modeling of anomalous SILC in Flash memories based on tunneling at multiple defects
2002-01-01 Ielmini, Daniele; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; A., Modelli
Theory of direct-tunneling current in metal-oxide-semiconductor structures
2002-01-01 R., Clerc; SOTTOCORNOLA SPINELLI, Alessandro; G., Ghibaudo; G., Pananakakis
A statistical model for SILC in Flash memories
2002-01-01 Ielmini, Daniele; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; A., Modelli
An analytical model for flat-band polysilicon quantization in MOS devices
2002-01-01 SOTTOCORNOLA SPINELLI, Alessandro; R., Clerc; G., Ghibaudo
2D QM simulation and optimization of decanano non-overlapped MOS devices
2003-01-01 Gusmeroli, Riccardo; SOTTOCORNOLA SPINELLI, Alessandro; Pirovano, Agostino; Lacaita, ANDREA LEONARDO; F., Boeuf; T., Skotnicki
Laser-based calibration for the HARP time of flight system
2003-01-01 M., Bonesini; F., Ferri; P., Govoni; M., Paganoni; A., Parravicini; A., Tonazzo; A., Andreoni; M., Bondani; F., Paleari; SOTTOCORNOLA SPINELLI, Alessandro; D., Gibin; A., Guglielmi; A., Menegolli
Experimental and Monte Carlo analysis of drain-avalanche hot-hole injection for reliability optimization in Flash memories
2003-01-01 Ielmini, Daniele; A., Ghetti; S., Beltrami; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; A., Visconti
Program/erase dynamics and channel conduction in nanocrystal memories
2003-01-01 MONZIO COMPAGNONI, Christian; Ielmini, Daniele; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; C., Gerardi; L., Perniola; B., De Salvo; S., Lombardo
The laser calibration system of the HARP TOF
2003-01-01 A., Andreoni; M., Bondani; M., Bonesini; F., Ferri; D., Gibin; P., Govoni; A., Guglielmi; A., Menegolli; M., Paganoni; F., Paleari; A., Parravicini; SOTTOCORNOLA SPINELLI, Alessandro; A., Tonazzo
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