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Titolo Data di pubblicazione Autori File
The laser calibration system of the HARP TOF 1-gen-2003 SOTTOCORNOLA SPINELLI, ALESSANDRO +
Experimental and Monte Carlo analysis of drain-avalanche hot-hole injection for reliability optimization in Flash memories 1-gen-2003 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
2D QM simulation and optimization of decanano non-overlapped MOS devices 1-gen-2003 GUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDROPIROVANO, AGOSTINOLACAITA, ANDREA LEONARDO +
Study of data retention for nanocrystal Flash memories 1-gen-2003 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDOPREVITALI, CRISTIAN +
Towards integrating the functions of cells with electrical processes 1-gen-2004 CIOFFI, MARGHERITAGIORDANO, CARMENGUSMEROLI, RICCARDORAIMONDI, MANUELA TERESASOTTOCORNOLA SPINELLI, ALESSANDRO
High-energy oxide traps and anomalous soft-programming in Flash memories 1-gen-2004 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Statistical analysis of nanocrystal memory reliability 1-gen-2004 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Optimization of the nonoverlap length in decanano MOS devices with 2-D QM simulations 1-gen-2004 GUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDROPIROVANO, AGOSTINOLACAITA, ANDREA LEONARDO +
Impact of correlated generation of oxide defects on SILC and breakdown distributions 1-gen-2004 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Detection of nondelayed photons in the forward-scattering of picosecond pulses 1-gen-2004 SOTTOCORNOLA SPINELLI, ALESSANDROZAMBRA, GUIDO +
Defect generation statistics in thin gate oxides 1-gen-2004 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A new channel percolation model for VT shift in discrete-trap memories 1-gen-2004 IELMINI, DANIELEMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A comparative study of characterization techniques for oxide reliability in Flash memories 1-gen-2004 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Improving floating-gate memory reliability by nanocrystal storage and pulsed tunnel programming 1-gen-2004 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Counting photoelectrons in the response of a photomultiplier tube to single picosecond light pulses 1-gen-2004 ZAMBRA, GUIDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Study of nanocrystal memory reliability by CAST structures 1-gen-2004 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Biocompatibility of semiconductor chip surface materials 1-gen-2005 GIORDANO, CARMENRAIMONDI, MANUELA TERESASOTTOCORNOLA SPINELLI, ALESSANDROCIOFFI, MARGHERITAGUSMEROLI, RICCARDO +
Integrating live cells with semiconductor devices: a biocompatibility assay 1-gen-2005 CIOFFI, MARGHERITAGIORDANO, CARMENGUSMEROLI, RICCARDORAIMONDI, MANUELA TERESASOTTOCORNOLA SPINELLI, ALESSANDROBARANAUSKAS, GYTIS
Reliability assessment of discrete-trap memories for NOR applications 1-gen-2005 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDOSOTGIU, RICCARDO
Optimization of threshold voltage window under tunneling program/erase in nanocrystal memories 1-gen-2005 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO
Mostrati risultati da 61 a 80 di 240
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