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Titolo Data di pubblicazione Autori File
Photon time-of-flight distribution through turbid media directly measured with single-photon avalanche diodes 1-gen-2003 SOTTOCORNOLA SPINELLI, ALESSANDRORECH, IVAN +
Laser-based calibration for the HARP time of flight system 1-gen-2003 SOTTOCORNOLA SPINELLI, ALESSANDRO +
How far will Silicon nanocrystals push the scaling limits of NVMs technologies? 1-gen-2003 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Analysis of quantum yield in n-channel MOSFETs 1-gen-2003 SOTTOCORNOLA SPINELLI, ALESSANDROIELMINI, DANIELELACAITA, ANDREA LEONARDO +
Towards integrating the functions of cells with electrical processes 1-gen-2004 CIOFFI, MARGHERITAGIORDANO, CARMENGUSMEROLI, RICCARDORAIMONDI, MANUELA TERESASOTTOCORNOLA SPINELLI, ALESSANDRO
A new channel percolation model for VT shift in discrete-trap memories 1-gen-2004 IELMINI, DANIELEMONZIO COMPAGNONI, CHRISTIANSOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Defect generation statistics in thin gate oxides 1-gen-2004 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
High-energy oxide traps and anomalous soft-programming in Flash memories 1-gen-2004 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Optimization of the nonoverlap length in decanano MOS devices with 2-D QM simulations 1-gen-2004 GUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDROPIROVANO, AGOSTINOLACAITA, ANDREA LEONARDO +
Impact of correlated generation of oxide defects on SILC and breakdown distributions 1-gen-2004 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Statistical analysis of nanocrystal memory reliability 1-gen-2004 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Improving floating-gate memory reliability by nanocrystal storage and pulsed tunnel programming 1-gen-2004 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A comparative study of characterization techniques for oxide reliability in Flash memories 1-gen-2004 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Study of nanocrystal memory reliability by CAST structures 1-gen-2004 MONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Detection of nondelayed photons in the forward-scattering of picosecond pulses 1-gen-2004 SOTTOCORNOLA SPINELLI, ALESSANDROZAMBRA, GUIDO +
Counting photoelectrons in the response of a photomultiplier tube to single picosecond light pulses 1-gen-2004 ZAMBRA, GUIDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
Recent developments on flash memory reliability 1-gen-2005 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO
Biocompatibility of semiconductor chip surface materials 1-gen-2005 GIORDANO, CARMENRAIMONDI, MANUELA TERESASOTTOCORNOLA SPINELLI, ALESSANDROCIOFFI, MARGHERITAGUSMEROLI, RICCARDO +
Program and SILC constraints on NC memories scaling: a Monte Carlo approach 1-gen-2005 GUSMEROLI, RICCARDOSOTTOCORNOLA SPINELLI, ALESSANDROMONZIO COMPAGNONI, CHRISTIANIELMINI, DANIELELACAITA, ANDREA LEONARDO +
Integrating live cells with semiconductor devices: a biocompatibility assay 1-gen-2005 CIOFFI, MARGHERITAGIORDANO, CARMENGUSMEROLI, RICCARDORAIMONDI, MANUELA TERESASOTTOCORNOLA SPINELLI, ALESSANDROBARANAUSKAS, GYTIS
Mostrati risultati da 61 a 80 di 232
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