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Mostrati risultati da 21 a 40 di 232
Titolo Data di pubblicazione Autori File
The impact of polysilicon quantization on ultra-thin oxide MOSFET characteristics 1-gen-2000 SOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A recombination model for transient and stationary stress-induced leakage current 1-gen-2000 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Role of interface and bulk defect-states in the low-voltage leakage conduction of ultrathin oxides 1-gen-2000 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Experimental evidence for recombination-assisted leakage in thin oxides 1-gen-2000 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO
Experimental and numerical analysis of the quantum yield 1-gen-2000 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Impact ionization and stress-induced leakage current in thin gate oxides 1-gen-2000 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Quantum-mechanical 2D simulation of surface- and buried-channel p-MOS 1-gen-2000 SOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Modeling of SILC based on electron and hole tunneling -- Part II: Steady-state 1-gen-2000 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Evidence for recombination at oxide defects and new SILC model 1-gen-2000 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Modeling of SILC based on electron and hole tunneling - Part I: transient effects 1-gen-2000 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Polysilicon quantization effects on the electrical properties of MOS transistors 1-gen-2000 SOTTOCORNOLA SPINELLI, ALESSANDROPACELLI, ANDREALACAITA, ANDREA LEONARDO
Different types of defects in silicon dioxide characterized by their transient behavior 1-gen-2001 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A recombination- and trap-assisted tunneling model for stress-induced leakage current 1-gen-2001 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Fully 2D quantum-mechanical simulation of nanoscale MOSFETs 1-gen-2001 LACAITA, ANDREA LEONARDOSOTTOCORNOLA SPINELLI, ALESSANDRO +
An improved formula for the determination of the polysilicon doping 1-gen-2001 SOTTOCORNOLA SPINELLI, ALESSANDROPACELLI, ANDREALACAITA, ANDREA LEONARDO
Electrical characterization and quantum modeling of MOS capacitors with ultra-thin oxides (1.4-3nm) 1-gen-2001 SOTTOCORNOLA SPINELLI, ALESSANDRO +
New technique for fast characterization of SILC distribution in Flash arrays 1-gen-2001 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A detailed investigation of the quantum yield experiment 1-gen-2001 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
A new conduction mechanism for the anomalous cells in thin oxide Flash EEPROMs 1-gen-2001 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDRO +
Statistical modeling of reliability and scaling projections for Flash memories 1-gen-2001 IELMINI, DANIELESOTTOCORNOLA SPINELLI, ALESSANDROLACAITA, ANDREA LEONARDO +
Mostrati risultati da 21 a 40 di 232
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