Origin of the Temperature Dependence of Gate-Induced Drain Leakage-Assisted Erase in Three-Dimensional NAND Flash Memories

Through detailed experimental and modeling activities, this paper investigates the origin of the temperature dependence of the Erase operation in 3D nand flash arrays. First of all, experimental data collected down to the cryogenic regime on both charge-trap and floating-gate arrays are provided to demonstrate that the reduction in temperature makes cells harder to Erase irrespective of the nature of their storage layer. This evidence is then attributed to the weakening, with the decrease in temperature, of the gate-induced drain leakage (GIDL) current exploited to set the electrostatic potential of the body of the nand strings during Erase. Modeling results for the GIDL-assisted Erase operation, finally, allow not only to support this conclusion but also to directly correlate the change with temperature of the electrostatic potential of the string body with the change with temperature of the erased threshold-voltage of the memory cells.