CAGLI, CARLO

CAGLI, CARLO  

DIPARTIMENTO DI ELETTRONICA E INFORMAZIONE (attivo dal 01/01/1900 al 31/12/2012)  

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Risultati 1 - 11 di 11 (tempo di esecuzione: 0.022 secondi).
Titolo Data di pubblicazione Autori File
Cell-based models for the switching statistics of RRAM 1-gen-2011 CAGLI, CARLOIELMINI, DANIELE +
"Conductive-filament switching analysis and self-accelerated thermal dissolution model for reset in NiO-based RRAM" 1-gen-2007 IELMINI, DANIELECAGLI, CARLOLACAITA, ANDREA LEONARDO +
Evidence for threshold switching in the set process of NiO-based RRAM and physical modeling for set, reset, retention and disturb prediction 1-gen-2008 CAGLI, CARLOIELMINI, DANIELENARDI, FEDERICOLACAITA, ANDREA LEONARDO
Nanowire-based RRAM crossbar memory with metallic core–oxide shell nanostructure 1-gen-2011 CAGLI, CARLONARDI, FEDERICOIELMINI, DANIELE +
Reliability of NiO-based resistive switching memory (ReRAM) elements with pillar W bottom electrode 1-gen-2009 NARDI, FEDERICOCAGLI, CARLOIELMINI, DANIELE +
Reset current reduction and set-reset instabilities in unipolar NiO RRAM 1-gen-2011 NARDI, FEDERICOCAGLI, CARLOIELMINI, DANIELE +
Resistance-dependent switching in NiO-based filamentary RRAM devices 1-gen-2010 IELMINI, DANIELECAGLI, CARLONARDI, FEDERICOLACAITA, ANDREA LEONARDO
Size-dependent temperature instability in NiO–based resistive switching memory 1-gen-2010 IELMINI, DANIELENARDI, FEDERICOCAGLI, CARLOLACAITA, ANDREA LEONARDO
Sub-10 microA reset in NiO-based resistive switching memory (RRAM) cells 1-gen-2010 NARDI, FEDERICOIELMINI, DANIELECAGLI, CARLO +
TRADE-OFF BETWEEN DATA RETENTION AND RESET IN NIO RRAMS 1-gen-2010 IELMINI, DANIELENARDI, FEDERICOCAGLI, CARLOLACAITA, ANDREA LEONARDO
Universal switching and noise characteristics of nanofilaments in metal-oxide RRAMs 1-gen-2010 IELMINI, DANIELENARDI, FEDERICOCAGLI, CARLO