CAGLI, CARLO

CAGLI, CARLO  

DIPARTIMENTO DI ELETTRONICA E INFORMAZIONE (attivo dal 01/01/1900 al 31/12/2012)  

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Risultati 1 - 15 di 15 (tempo di esecuzione: 0.045 secondi).
Titolo Data di pubblicazione Autori File
Analysis and modeling of resistive switching statistics 1-gen-2012 CAGLI, CARLOIELMINI, DANIELE +
Control of filament size and reduction of reset current below 10 μA in NiO resistance switching memories 1-gen-2011 NARDI, FEDERICOIELMINI, DANIELECAGLI, CARLO +
Filament conduction and reset mechanism in NiO-based resistive-switching memory (RRAM) devices 1-gen-2009 RUSSO, UGOIELMINI, DANIELECAGLI, CARLOLACAITA, ANDREA LEONARDO
Filament diffusion model for simulating reset and retention processes in RRAM 1-gen-2011 CAGLI, CARLONARDI, FEDERICOIELMINI, DANIELE +
Impact of electrode materials on resistive-switching memory (RRAM) programmning 1-gen-2009 CAGLI, CARLOIELMINI, DANIELE +
Nanowire-based resistive switching memories: devices, operation and scaling 1-gen-2013 IELMINI, DANIELECAGLI, CARLONARDI, FEDERICO +
Physical models of size-dependent nanofilament formation and rupture in NiO resistive switching memories 1-gen-2011 IELMINI, DANIELECAGLI, CARLONARDI, FEDERICO
Reset instability in pulsed-operated unipolar resistive switching memory 1-gen-2011 NARDI, FEDERICOCAGLI, CARLOIELMINI, DANIELE +
Resistance transition in metal oxides induced by electronic threshold switching 1-gen-2009 IELMINI, DANIELECAGLI, CARLONARDI, FEDERICO
Resistance-dependent amplitude of random telegraph-signal noise in resistive switching memories 1-gen-2010 IELMINI, DANIELENARDI, FEDERICOCAGLI, CARLO
Resistive-switching crossbar memory based on Ni-NiO core-shell nanowires 1-gen-2011 CAGLI, CARLONARDI, FEDERICOIELMINI, DANIELE +
Scaling analysis of submicrometer nickel-oxide-based resistive switching memory devices 1-gen-2011 IELMINI, DANIELENARDI, FEDERICOCAGLI, CARLO +
Self-Accelerated Thermal Dissolution Model for Reset Programming in Unipolar Resistive-Switching Memory (RRAM) Devices. 1-gen-2009 RUSSO, UGOIELMINI, DANIELECAGLI, CARLOLACAITA, ANDREA LEONARDO
Size-dependent retention time in NiO-based resistive switching memories 1-gen-2010 IELMINI, DANIELENARDI, FEDERICOCAGLI, CARLOLACAITA, ANDREA LEONARDO
Universal reset characteristics of unipolar and bipolar metal-oxide RRAM 1-gen-2011 IELMINI, DANIELENARDI, FEDERICOCAGLI, CARLO