MICCOLI, CARMINE
MICCOLI, CARMINE
DIPARTIMENTO DI ELETTRONICA E INFORMAZIONE (attivo dal 01/01/1900 al 31/12/2012)
Impact of control-gate and floating-gate design on the electron-injection spread of decananometer NAND Flash memories
2010-01-01 MONZIO COMPAGNONI, Christian; Miccoli, Carmine; Lacaita, ANDREA LEONARDO; A., Marmiroli; SOTTOCORNOLA SPINELLI, Alessandro; A., Visconti
Impact of neutral threshold-voltage spread and electron-emission statistics on data retention of nanoscale NAND Flash
2010-01-01 Miccoli, Carmine; MONZIO COMPAGNONI, Christian; Amoroso, SALVATORE MARIA; A., Spessot; P., Fantini; A., Visconti; SOTTOCORNOLA SPINELLI, Alessandro
Random telegraph noise-induced sensitivity of data retention to cell position in the programmed distribution of NAND Flash memory arrays
2015-01-01 Resnati, Davide; MONZIO COMPAGNONI, Christian; Paolucci, GIOVANNI MARIA; Miccoli, Carmine; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; Visconti, Angelo; Goda, Akira
Reliability characterization issues for nanoscale Flash memories: a case study on 45-nm NOR devices
2013-01-01 Miccoli, Carmine; MONZIO COMPAGNONI, Christian; L., Chiavarone; S., Beltrami; Lacaita, ANDREA LEONARDO; SOTTOCORNOLA SPINELLI, Alessandro; A., Visconti
Revisiting charge trapping/detrapping in Flash memories from a discrete and statistical standpoint - Part I: VT instabilities
2014-01-01 Paolucci, GIOVANNI MARIA; MONZIO COMPAGNONI, Christian; Miccoli, Carmine; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; A., Visconti
Revisiting charge trapping/detrapping in Flash memories from a discrete and statistical standpoint - Part II: on-field operation and distributed-cycling effects
2014-01-01 Paolucci, GIOVANNI MARIA; MONZIO COMPAGNONI, Christian; Miccoli, Carmine; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO; A., Visconti
String current in decananometer NAND Flash arrays: a compact-modeling investigation
2012-01-01 Paolucci, GIOVANNI MARIA; Miccoli, Carmine; MONZIO COMPAGNONI, Christian; SOTTOCORNOLA SPINELLI, Alessandro; Lacaita, ANDREA LEONARDO
Threshold-voltage instability due to damage recovery in nanoscale NAND Flash memories
2011-01-01 Miccoli, Carmine; MONZIO COMPAGNONI, Christian; S., Beltrami; SOTTOCORNOLA SPINELLI, Alessandro; A., Visconti