RE.PUBLIC@POLIMI pubblicazioni di ricerca del Politecnico di Milano

CAGLI, CARLO
 Distribuzione geografica
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Continente #
NA - Nord America 1.585
EU - Europa 476
AS - Asia 112
Continente sconosciuto - Info sul continente non disponibili 2
SA - Sud America 1
Totale 2.176
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Nazione #
US - Stati Uniti d'America 1.570
UA - Ucraina 100
AT - Austria 81
SE - Svezia 62
DE - Germania 47
IT - Italia 42
FI - Finlandia 37
GB - Regno Unito 35
CN - Cina 28
JO - Giordania 28
VN - Vietnam 28
IE - Irlanda 23
CA - Canada 15
SI - Slovenia 15
FR - Francia 14
BE - Belgio 11
JP - Giappone 7
KR - Corea 7
TW - Taiwan 6
RU - Federazione Russa 5
IN - India 3
EU - Europa 2
HK - Hong Kong 2
IR - Iran 2
NL - Olanda 2
RO - Romania 2
MY - Malesia 1
PE - Perù 1
Totale 2.176
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Città #
Fairfield 256
Woodbridge 183
Ann Arbor 129
Ashburn 121
Chandler 120
Seattle 117
Houston 115
Wilmington 107
Cambridge 88
Vienna 81
Jacksonville 57
Dearborn 35
Lawrence 29
Medford 29
Amman 28
Dublin 22
Des Moines 18
Beijing 17
Dong Ket 14
Ottawa 14
San Diego 11
Brussels 10
Helsinki 8
Milan 7
Portland 5
Moriyama 4
Seongnam 4
Taipei 4
Boardman 3
London 3
Los Angeles 3
Norwalk 3
Redwood City 3
Verona 3
Acton 2
Auburn Hills 2
Berlin 2
Cluj-napoca 2
Fremont 2
Gif-sur-yvette 2
Hefei 2
Honcho 2
Kunming 2
New York 2
Velikiy Novgorod 2
Zhengzhou 2
Aachen 1
Amsterdam 1
Atlanta 1
Central 1
Central District 1
Columbus 1
Frankfurt An Der Oder 1
Frankfurt am Main 1
Groningen 1
Indiana 1
Kish 1
Lima 1
Nanjing 1
New Delhi 1
Pistoia 1
Quzhou 1
Southend 1
Toronto 1
Tronoh 1
Ufa 1
Villeurbanne 1
Totale 1.696
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Nome #
"Conductive-filament switching analysis and self-accelerated thermal dissolution model for reset in NiO-based RRAM" 164
Resistive-switching crossbar memory based on Ni-NiO core-shell nanowires 97
Filament conduction and reset mechanism in NiO-based resistive-switching memory (RRAM) devices 95
Reset current reduction and set-reset instabilities in unipolar NiO RRAM 93
Size-dependent temperature instability in NiO–based resistive switching memory 90
Resistance-dependent amplitude of random telegraph-signal noise in resistive switching memories 89
Resistance transition in metal oxides induced by electronic threshold switching 87
Evidence for threshold switching in the set process of NiO-based RRAM and physical modeling for set, reset, retention and disturb prediction 86
Analysis and modeling of resistive switching statistics 86
Cell-based models for the switching statistics of RRAM 85
Nanowire-based RRAM crossbar memory with metallic core–oxide shell nanostructure 84
Universal reset characteristics of unipolar and bipolar metal-oxide RRAM 84
Reliability of NiO-based resistive switching memory (ReRAM) elements with pillar W bottom electrode 82
Reset Statistics of NiO-Based Resistive Switching Memories 81
Control of filament size and reduction of reset current below 10 μA in NiO resistance switching memories 78
TRADE-OFF BETWEEN DATA RETENTION AND RESET IN NIO RRAMS 72
Self-Accelerated Thermal Dissolution Model for Reset Programming in Unipolar Resistive-Switching Memory (RRAM) Devices. 72
Physical models of size-dependent nanofilament formation and rupture in NiO resistive switching memories 68
Impact of electrode materials on resistive-switching memory (RRAM) programmning 68
Filament diffusion model for simulating reset and retention processes in RRAM 66
Nanowire-based resistive switching memories: devices, operation and scaling 61
Size-dependent retention time in NiO-based resistive switching memories 61
Scaling analysis of submicrometer nickel-oxide-based resistive switching memory devices 59
Sub-10 microA reset in NiO-based resistive switching memory (RRAM) cells 50
Modeling of set/reset operations in NiO-based resistive-switching memory (RRAM) devices 49
Resistance-dependent switching in NiO-based filamentary RRAM devices 47
Resistive-Switching Memory Devices Based on Metal Oxides: Modeling of Unipolar Switching, Reliability, and Scaling 45
Universal switching and noise characteristics of nanofilaments in metal-oxide RRAMs 44
Reset instability in pulsed-operated unipolar resistive switching memory 36
Totale 2.179
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Categoria #
all - tutte 6.514
article - articoli 3.815
book - libri 0
conference - conferenze 2.558
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 141
Totale 13.028
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2018/2019240 0 0 0 0 0 0 0 0 0 53 100 87
2019/2020576 37 40 13 44 73 66 81 55 70 27 54 16
2020/2021345 25 17 34 14 97 13 24 30 14 23 19 35
2021/2022246 12 37 23 37 9 4 17 8 11 12 24 52
2022/2023295 33 11 35 23 38 37 0 22 66 4 21 5
2023/202494 10 23 9 11 3 9 19 3 0 7 0 0
Totale 2.179