RUGGERI, ALESSANDRO
RUGGERI, ALESSANDRO
DIPARTIMENTO DI ELETTRONICA, INFORMAZIONE E BIOINGEGNERIA
100 Mcount/s InGaAs/InP single-photon detector
2014-01-01 Scarcella, Carmelo; Boso, Gianluca; Acerbi, Fabio; Ruggeri, Alessandro; Adriano Della, Frera; Tosi, Alberto
32 Channels SPAD Array for Single Photon Timing Applications
2012-01-01 Scarcella, Carmelo; Bellisai, Simone; DELLA FRERA, Adriano; Ruggeri, Alessandro; Tisa, Simone; Tosi, Alberto; Zappa, Franco
Afterpulsing reduction for InGaAs/InP SPAD with integrated diffused resistor
2015-01-01 Sanzaro, Mirko; Calandri, Niccolo'; Ruggeri, Alessandro; Acerbi, Fabio; Tosi, Alberto
An extremely low-noise heralded single-photon source without temporal post-selection
2013-01-01 Fabrizio, Piacentini; Paolo, Traina; DELLA FRERA, Adriano; Tosi, Alberto; Scarcella, Carmelo; Ruggeri, Alessandro; Gulinatti, Angelo; Ghioni, MASSIMO ANTONIO; Sergey V., Polyakov; Alan, Migdall; Andrea, Giudice; Giorgio, Brida; Ivo Pietro, Degiovanni; Marco, Genovese
Analog SiPM in Planar CMOS Technology
2014-01-01 Villa, FEDERICA ALBERTA; Bronzi, Danilo; M., Vergani; Zou, Yu; Ruggeri, Alessandro; Zappa, Franco; DALLA MORA, Alberto
Bimodal ultrasonic probe comprising an optical device for diagnosis
2023-01-01 Tisa, Simone; Ruggeri, Alessandro; Rosinski, Bogdan; Montauban, Emmanuel; Dinten, Jean-Marc; Pifferi, Antonio; Taroni, Paola; DALLA MORA, Alberto; Tosi, Alberto
Breast lesion classification based on absorption and composition parameters: a look at SOLUS first outcomes
2023-01-01 Maffeis, G.; Pifferi, A.; Dalla Mora, A.; Di Sieno, L.; Cubeddu, R.; Tosi, A.; Conca, E.; Giudice, A.; Ruggeri, A.; Tisa, S.; Flocke, A.; Rosinski, B.; Dinten, J. -M.; Perriollat, M.; Fraschini, C.; Lavaud, J.; Arridge, S.; Di Sciacca, G.; Farina, A.; Panizza, P.; Venturini, E.; Gordebeke, P.; Taroni, P.
Cost-Effective High-Performance Single-Photon Detection System
2015-01-01 Tamborini, Davide; Buttafava, Mauro; Ruggeri, Alessandro; Boso, Gianluca; Tosi, Alberto; Zappa, Franco
Diffuse optical characterization of collagen absorption from 500 to 1700 nm
2017-01-01 KONUGOLU VENKATA SEKAR, Sanathana; Bargigia, Ilaria; Dalla Mora, Alberto; Taroni, Paola; Ruggeri, Alessandro; Tosi, Alberto; Pifferi, ANTONIO GIOVANNI; Farina, Andrea
High count rate InGaAs/InP SPAD system with balanced SPAD-dummy approach running up to 1.4 GHz
2018-01-01 Sanzaro, M.; Ruggeri, A.; Peruch, A.; Tosi, A.
High Detection Rate Fast-Gated CMOS Single-Photon Avalanche Diode Module
2020-01-01 Renna, M.; Ruggeri, A.; Sanzaro, M.; Villa, F.; Zappa, F.; Tosi, A.
High Stability InGaAs/InP Single-Photon Detector with Gigahertz Sinusoidal Gating
2015-01-01 Ruggeri, Alessandro; Ciuffolini, Marco; Calandri, Niccolo'; Sanzaro, Mirko; Scarcella, Carmelo; Boso, Gianluca; Tosi, Alberto
InGaAs/InP Single-Photon Avalanche Diodes working up to 100 Mcount/s
2013-01-01 Tosi, Alberto; Acerbi, Fabio; Scarcella, Carmelo; Boso, Gianluca; DELLA FRERA, Adriano; Ruggeri, Alessandro; Zappa, Franco
InGaAs/InP single-photon detector gated at 1.3 GHz with 1.5% afterpulsing
2015-01-01 Scarcella, Carmelo; Boso, Gianluca; Ruggeri, Alessandro; Tosi, Alberto
InGaAs/InP single-photon detector with low noise, low timing jitter and high count rate
2015-01-01 Sanzaro, Mirko; Calandri, Niccolo'; Ruggeri, Alessandro; Scarcella, Carmelo; Boso, Gianluca; Buttafava, Mauro; Tosi, Alberto
InGaAs/InP SPAD photon-counting module with auto-calibrated gate-width generation and remote control
2013-01-01 Tosi, Alberto; Ruggeri, Alessandro; BAHGAT SHEHATA, Andrea; DELLA FRERA, Adriano; Scarcella, Carmelo; Tisa, Simone; Andrea, Giudice
InGaAs/InP SPAD with Monolithically Integrated Zinc-Diffused Resistor
2016-01-01 Sanzaro, Mirko; Calandri, Niccolo'; Ruggeri, Alessandro; Tosi, Alberto
Integrated Circuit for Subnanosecond Gating of InGaAs/InP SPAD
2015-01-01 Ruggeri, Alessandro; Ciccarella, Pietro; Villa, FEDERICA ALBERTA; Zappa, Franco; Tosi, Alberto
Kilometer-range depth imaging at 1550 nm wavelength using an InGaAs/InP single-photon avalanche diode detector
2013-01-01 Aongus, Mccarthy; Ximing, Ren; DELLA FRERA, Adriano; Nathan R., Gemmell; Nils J., Krichel; Scarcella, Carmelo; Ruggeri, Alessandro; Tosi, Alberto; Gerald S., Buller
Kilometer-range depth imaging using an InGaAs/InP single-photon avalanche diode detector operating at a wavelength of 1550 nm
2013-01-01 Aongus, Mccarthy; Ximing, Ren; DELLA FRERA, Adriano; Nathan R., Gemmell; Nils J., Krichel; Scarcella, Carmelo; Ruggeri, Alessandro; Tosi, Alberto; Gerald S., Buller