IRDE, GABRIELE
Charge carrier dynamics at doped silicon surface by ultrafast scanning electron microscopy
2017-01-01 Sala, Vittorio; Pietralunga, SILVIA MARIA; Zani, Maurizio; Irde, Gabriele; Manzoni, Cristian; Isella, Giovanni; Cerullo, GIULIO NICOLA; Lanzani, Guglielmo; Tagliaferri, Alberto
Charge carrier dynamics by secondary electron detection in ultrafast scanning electron microscopy
2017-01-01 Sala, Vittorio; Pietralunga, SILVIA MARIA; Zani, Maurizio; Irde, Gabriele; Manzoni, Cristian; Isella, Giovanni; Cerullo, GIULIO NICOLA; Lanzani, Guglielmo; Tagliaferri, Alberto
Charge dynamics in aluminum oxide thin film revealed by ultrafast scanning electron microscopy
2017-01-01 Sala, Vittorio; Zani, Maurizio; Irde, Gabriele; Pietralunga, SILVIA MARIA; Cerullo, GIULIO NICOLA; Lanzani, Guglielmo; Tagliaferri, Alberto
Dynamic SEM imaging of surface photovoltages in MAPbI3 perovskites
2017-01-01 Irde, Gabriele; Pietralunga, SILVIA MARIA; James, Ball; Alex, Barker; Sala, Vittorio; Zani, Maurizio; Petrozza, Annamaria; Lanzani, Guglielmo; Tagliaferri, Alberto
Dynamical imaging of local photovoltage at semiconductor surface by photo-assisted ultrafast scanning electron microscopy
2021-01-01 Zaghloul, Mohamed; Pietralunga, Silvia M.; Irde, Gabriele; Sala, Vittorio; Cerullo, GIULIO NICOLA FELICE; Chen, Hao; Isella, Giovanni; Lanzani, Guglielmo; Zani, Maurizio; Tagliaferri, Alberto
Electron dynamics in aluminum oxide thin film revealed by Ultrafast Scanning Electron Microscopy (USEM)
2017-01-01 Sala, Vittorio; Zani, Maurizio; Irde, Gabriele; Pietralunga, SILVIA MARIA; Cerullo, GIULIO NICOLA; Lanzani, Guglielmo; Tagliaferri, Alberto
Large surface polarization buildup and charge dynamics in lead-halide hybrid perovskite films under very intense optical irradiance
2019-01-01 Pietralunga, SILVIA MARIA; Irde, Gabriele; Sala, Vittorio; Zani, Maurizio; Ball, James M.; J Barker, Alex; Petrozza, Annamaria; Lanzani, Guglielmo; Tagliaferri, Alberto
Laser assisted Ultrafast Scanning Electron Microscopy (USEM) probing surface charge dynamics in oxide thin films
2018-01-01 Pietralunga, SILVIA MARIA; Sala, Vittorio; Irde, Gabriele; Cerullo, GIULIO NICOLA FELICE; Lanzani, Guglielmo; Zani, Maurizio; Tagliaferri, Alberto
Perspectives of ultrafast hyperspectral imaging in Scanning Electron Microscopy
2023-01-01 Tagliaferri, Alberto; KOSARI MEHR, Abbas; Zaghloul, Mohamed; Cao, Wenzheng; Chen, Hao; Irde, Gabriele; Sala, Vittorio; Cerullo, Giulio; Isella, Giovanni; Lanzani, Guglielmo; Zani, Maurizio; Khursheed, Anjam; Pietralunga, Silvia
Photon assisted ultrafast scanning electron microscopy
2017-01-01 Pietralunga, SILVIA MARIA; Zani, Maurizio; Sala, Vittorio; Irde, Gabriele; Manzoni, Cristian; Cerullo, GIULIO NICOLA; Lanzani, Guglielmo; Tagliaferri, Alberto
Photon induced charge dynamics in aluminum oxide films by ultrafast scanning electron microscopy
2016-01-01 Sala, Vittorio; Zani, Maurizio; Irde, Gabriele; Pietralunga, S. M.; Cerullo, GIULIO NICOLA; Lanzani, Guglielmo; Tagliaferri, Alberto
Probing the photophysics of lead-halide hybrid perovskite junctions under very intense optical irradiance
2020-01-01 Pietralunga, Silvia M.; Irde, Gabriele; Barker, Alex J.; Ball, James M.; Sala, Vittorio; Zani, Maurizio; Petrozza, Annamaria; Lanzani, Guglielmo; Tagliaferri, Alberto
Real-time dynamical imaging of light induced photo-voltages in hybrid halide perovskites by Scanning Electron Microscopy
2018-01-01 Irde, Gabriele; Pietralunga, SILVIA MARIA; Sala, Vittorio; Zani, Maurizio; James, Ball; Barker, Alex J.; Petrozza, Annamaria; Lanzani, Guglielmo; Tagliaferri, Alberto
Time-resolved 2D mapping of surface photovoltages and charge dynamics in semiconductors by SEM
2023-01-01 Pietralunga, Silvia; Irde, Gabriele; Sala, Vittorio; Zani, Maurizio; Ball, James M.; Barker, Alex J.; Petrozza, Annamaria; Lanzani, Guglielmo; Tagliaferri, Alberto
UHV Ultrafast Scanning Electron Microscopy
2019-01-01 Pietralunga, Silvia M.; Sala, Vittorio; Zani, Maurizio; Irde, Gabriele; Cerullo, GIULIO NICOLA FELICE; Lanzani, Guglielmo; Tagliaferri, Alberto
Ultrafast Scanning Electron Microscopy (USEM) to probe charge dynamics at surfaces of oxide thin films
2018-01-01 Pietralunga, S. M.; Sala, V.; Manzoni, C.; Cerullo, G.; Lanzani, G.; Irde, G.; Zani, M.; Tagliaferri, A.
Ultrafast Scanning Electron Microscopy (USEM) to probe charge dynamics in oxide thin films
2018-01-01 Pietralunga, SILVIA MARIA; Sala, Vittorio; Cerullo, GIULIO NICOLA FELICE; Lanzani, Guglielmo; Irde, Gabriele; Zani, Maurizio; Tagliaferri, Alberto