KHURSHEED, ANJAM
Graphene Cold Field-Emission Sources for Electron Microscopy Applications
2023-01-01 Khursheed, A.; Shao, X.
Graphene Membrane Electrochemical Cell for High-Vacuum SEM Observation of Electrocatalytic Reactions
2026-01-01 Afshar, Erfan; Kosari Mehr, Abbas; Ritik, Ritik; Cao, Wenzheng; Khursheed, Anjam; Pietralunga, Silvia Maria; Anzi, Luca; Bussetti, Gianlorenzo; Tagliaferri, Alberto
High-Vacuum Scanning Electron Microscopy Characterization of Electrochemical Reactions
2025-01-01 Afshar, Erfan; Kosari Mehr, Abbas; Ritik, Ritik; Khan, Madiha; Cao, Wenzheng; Pietralunga, Silvia Maria; Khursheed, Anjam; Tagliaferri, Alberto
IM1-O-3 Perspectives of ultrafast hyperspectral imaging in Scanning Electron Microscopy
2025-01-01 Tagliaferri, Alberto; Kosari Mehr, Abbas; Afshar, Erfan; Khan, Madiha; Ritik, Ritik; Zaghloul, Mohamed; Cao, Wenzheng; Khursheed, Anjam; Pietralunga, Silvia Maria
IM1-P-7 Quantum state secondary electron emission spectroscopy in low voltage scanning electron microscope for probing Valence band
2025-01-01 Kosari Mehr, Abbas; Zaghloul, Mohamed; Ritik, Ritik; Cao, Wenzheng; Khan, Madiha; Afshar, Erfan; Pietralunga, Silvia Maria; Khursheed, Anjam; Tagliaferri, Alberto
IM3-P-8 Surface and sub-surface defect analysis in semiconductors by Secondary Electron Emission Spectroscopy and local charge transport mapping
2025-01-01 Ritik, Ritik; Cao, Wenzheng; Kosari Mehr, Abbas; Afshar, Erfan; Khan, Madiha; Giani, Raffaele; Khursheed, Anjam; Isella, Giovanni; Pietralunga, Silvia Maria; Tagliaferri, Alberto
Linear and nonlinear optical properties of dewetted SiGe islands
2022-01-01 Fagiani, L.; Granchi, N.; Zilli, A.; Barri, C.; Rusconi, F.; Montanari, M.; Mafakheri, E.; Celebrano, M.; Bouabdellaoui, M.; Abbarchi, M.; Intonti, F.; Khursheed, A.; Biagioni, P.; Finazzi, M.; Vincenti, M. A.; Bollani, M.
Perspectives of ultrafast hyperspectral imaging in Scanning Electron Microscopy
2023-01-01 Tagliaferri, Alberto; KOSARI MEHR, Abbas; Zaghloul, Mohamed; Cao, Wenzheng; Chen, Hao; Irde, Gabriele; Sala, Vittorio; Cerullo, Giulio; Isella, Giovanni; Lanzani, Guglielmo; Zani, Maurizio; Khursheed, Anjam; Pietralunga, Silvia
Perspectives of ultrafast hyperspectral imaging in Scanning Electron Microscopy
2025-01-01 Tagliaferri, Alberto; Kosari Mehr, Abbas; Khan, Madiha; Ritik, Ritik; Zaghloul, Mohamed; Cao, Wenzheng; Khursheed, Anjam; Pietralunga, Silvia Maria
Scanning electron microscopy
2024-01-01 Khursheed, Anjam
Secondary-Electron-Energy-Spectroscopy (SEES) for Semiconductor Surface Defect Characterization
2026-01-01 Ritik, Ritik; Kosari Mehr, Abbas; Cao, Wenzheng; Afshar, Erfan; De Cerdeira Oliveira, Afonso; Faverzani, Marco; Bollani, Monica; Isella, Giovanni; Khursheed, Anjam; Pietralunga, Silvia Maria; Tagliaferri, Alberto
Surface and defect analysis in advanced materials: leveraging EBIC and SEES in SEM
2024-01-01 Ritik, Ritik; Kosari Mehr, Abbas; Zaghloul, Mohamed; Cao, Wenzheng; Khursheed, Anjam; Pietralunga, Silvia Maria; Tagliaferri, Alberto
Surface and sub-surface defect analysis in semiconductors by Secondary Electron Emission Spectroscopy and local charge transport mapping
2025-01-01 Ritik, Ritik; Cao, Wenzheng; Kosari Mehr, Abbas; Afshar, Erfan; Khan, Madiha; Giani, Raffaele; Khursheed, Anjam; Isella, Giovanni; Pietralunga, Silvia Maria; Tagliaferri, Alberto
Surface-sensitive secondary electron emission spectroscopy in low voltage scanning electron microscope for Valence Band analysis
2025-01-01 Kosari Mehr, Abbas; Zaghloul, Mohamed; Cao, Wenzheng; Afshar, Erfan; Pietralunga, Silvia Maria; Khursheed, Anjam; Tagliaferri, Alberto
The Design of a Reflection Electron Energy Loss Spectrometer Attachment for Low Voltage Scanning Electron Microscopy
2021-01-01 Chuah, Jonathan; Khursheed, Anjam