RUSSO, UGO
RUSSO, UGO
DIPARTIMENTO DI ELETTRONICA E INFORMAZIONE (attivo dal 01/01/1900 al 31/12/2012)
Analytical modeling of chalcogenide crystallization for PCM data-retention extrapolation
2007-01-01 Russo, Ugo; Ielmini, Daniele; Lacaita, ANDREA LEONARDO
Filament conduction and reset mechanism in NiO-based resistive-switching memory (RRAM) devices
2009-01-01 Russo, Ugo; Ielmini, Daniele; Cagli, Carlo; Lacaita, ANDREA LEONARDO
Intrinsic data retenction in nanoscaled phase-change memories - Part II: Statistical analysis and prediction of failure time
2006-01-01 Redaelli, Andrea; Ielmini, Daniele; Russo, Ugo; Lacaita, ANDREA LEONARDO
Intrinsic data retention in nanoscaled phase-change memories - Part I: Monte Carlo model for crystallization and percolation
2006-01-01 Russo, Ugo; Ielmini, Daniele; Redaelli, Andrea; Lacaita, ANDREA LEONARDO
Modeling and simulation of conduction characteristics and programming operation in nanoscaled phase-change memory cells
2008-01-01 Redaelli, Andrea; Ielmini, Daniele; Russo, Ugo; Lacaita, ANDREA LEONARDO
Modeling of programming and read performance in phase-change memories - Part I: cell optimization and scaling
2008-01-01 Russo, Ugo; Ielmini, Daniele; Redaelli, Andrea; Lacaita, ANDREA LEONARDO
Self-Accelerated Thermal Dissolution Model for Reset Programming in Unipolar Resistive-Switching Memory (RRAM) Devices.
2009-01-01 Russo, Ugo; Ielmini, Daniele; Cagli, Carlo; Lacaita, ANDREA LEONARDO
Study of multilevel programming in programmable metallization cell (PMC) memory
2009-01-01 Russo, Ugo; D., Kalamanathan; Ielmini, Daniele; Lacaita, ANDREA LEONARDO; M. N., Kozicki
Voltage-driven ON-OFF transition and tradeoff with program and erase current in programmable metallization cell (PMC) memory
2009-01-01 D., Kamalanathan; Russo, Ugo; Ielmini, Daniele; M. N., Kozicki