RITIK, RITIK
Graphene Membrane Electrochemical Cell for High-Vacuum SEM Observation of Electrocatalytic Reactions
2026-01-01 Afshar, Erfan; Kosari Mehr, Abbas; Ritik, Ritik; Cao, Wenzheng; Khursheed, Anjam; Pietralunga, Silvia Maria; Anzi, Luca; Bussetti, Gianlorenzo; Tagliaferri, Alberto
High-Vacuum Scanning Electron Microscopy Characterization of Electrochemical Reactions
2025-01-01 Afshar, Erfan; Kosari Mehr, Abbas; Ritik, Ritik; Khan, Madiha; Cao, Wenzheng; Pietralunga, Silvia Maria; Khursheed, Anjam; Tagliaferri, Alberto
IM1-O-3 Perspectives of ultrafast hyperspectral imaging in Scanning Electron Microscopy
2025-01-01 Tagliaferri, Alberto; Kosari Mehr, Abbas; Afshar, Erfan; Khan, Madiha; Ritik, Ritik; Zaghloul, Mohamed; Cao, Wenzheng; Khursheed, Anjam; Pietralunga, Silvia Maria
IM1-P-7 Quantum state secondary electron emission spectroscopy in low voltage scanning electron microscope for probing Valence band
2025-01-01 Kosari Mehr, Abbas; Zaghloul, Mohamed; Ritik, Ritik; Cao, Wenzheng; Khan, Madiha; Afshar, Erfan; Pietralunga, Silvia Maria; Khursheed, Anjam; Tagliaferri, Alberto
IM3-P-8 Surface and sub-surface defect analysis in semiconductors by Secondary Electron Emission Spectroscopy and local charge transport mapping
2025-01-01 Ritik, Ritik; Cao, Wenzheng; Kosari Mehr, Abbas; Afshar, Erfan; Khan, Madiha; Giani, Raffaele; Khursheed, Anjam; Isella, Giovanni; Pietralunga, Silvia Maria; Tagliaferri, Alberto
Perspectives of ultrafast hyperspectral imaging in Scanning Electron Microscopy
2025-01-01 Tagliaferri, Alberto; Kosari Mehr, Abbas; Khan, Madiha; Ritik, Ritik; Zaghloul, Mohamed; Cao, Wenzheng; Khursheed, Anjam; Pietralunga, Silvia Maria
Secondary-Electron-Energy-Spectroscopy (SEES) for Semiconductor Surface Defect Characterization
2026-01-01 Ritik, Ritik; Kosari Mehr, Abbas; Cao, Wenzheng; Afshar, Erfan; De Cerdeira Oliveira, Afonso; Faverzani, Marco; Bollani, Monica; Isella, Giovanni; Khursheed, Anjam; Pietralunga, Silvia Maria; Tagliaferri, Alberto
Surface and defect analysis in advanced materials: leveraging EBIC and SEES in SEM
2024-01-01 Ritik, Ritik; Kosari Mehr, Abbas; Zaghloul, Mohamed; Cao, Wenzheng; Khursheed, Anjam; Pietralunga, Silvia Maria; Tagliaferri, Alberto
Surface and sub-surface defect analysis in semiconductors by Secondary Electron Emission Spectroscopy and local charge transport mapping
2025-01-01 Ritik, Ritik; Cao, Wenzheng; Kosari Mehr, Abbas; Afshar, Erfan; Khan, Madiha; Giani, Raffaele; Khursheed, Anjam; Isella, Giovanni; Pietralunga, Silvia Maria; Tagliaferri, Alberto