AHMED, IBRAHIM
A Grey-Box Digital Twin-based Approach for Risk Monitoring of Nuclear Power Plants
2022-01-01 Miqueles, Leonardo; Ahmed, Ibrahim; Maio, Francesco Di; Zio, Enrico
A Method based on Gaussian Process Regression for Modelling Burn-in of Semiconductor Devices
2021-01-01 Baraldi, Piero; Medici, Stefano; Ahmed, Ibrahim; Zio, Enrico; Lewitschnig, Horst
A Multistage Physics-Informed Neural Network for Fault Detection in Regulating Valves of Nuclear Power Plants
2024-01-01 Lai, C.; Ahmed, I.; Zio, E.; Li, W.; Zhang, Y.; Yao, W.; Chen, J.
A novel methodology based on long short-term memory stacked autoencoders for unsupervised detection of abnormal working conditions in semiconductor manufacturing systems
2024-01-01 Hosseinpour, Fatemeh; Ahmed, Ibrahim; Baraldi, Piero; Zio, Enrico; Behzad, Mehdi; Horst Lewitschnig, And
An Artificial Intelligence-Based Framework for Burn-in Reduction in the Semiconductor Manufacturing Industry
2024-01-01 Ahmed, Ibrahim; Hosseinpour, Fatemeh; Baraldi, Piero; Zio, Enrico; Lewitschnig, Horst
Enhancing accuracy of prediction of critical heat flux in Circular channels by ensemble of deep sparse autoencoders and deep neural Networks
2024-01-01 Zubair Khalid, R.; Ahmed, I.; Ullah, A.; Zio, E.; Khan, A.
Estimation of the Case Temperature of Insulated Gate Bipolar Temperatures in Induction Cooktops by Deep Neural Network
2022-01-01 Juybari, Mohammad N.; Ahmed, Ibrahim; Baraldi, Piero; Cueto, Alejandro Del; Gil, Javier; Lai, Chenyang; Llorente, Sergio; Zio, Enrico
Fault Detection by Signal Reconstruction in Nuclear Power Plants
2022-01-01 Ahmed, Ibrahim; Zio, Enrico; Heo, Gyunyoung
Integration of artificial intelligence within an advanced filtering framework for real-time system state estimation and risk prediction with application to a nuclear microreactor
2024-01-01 Ahmed, Ibrahim; Croci, Andrea; Antonello, Federico; Zio, Enrico
Monitoring Degradation of Insulated Gate Bipolar Transistors in Induction Cooktops by Artificial Neural Networks
2022-01-01 Lai, Chenyang; Baraldi, Piero; Ahmed, Ibrahim; Zio, Enrico; del Cueto, Alejandro; Gil, Javier; Llorente, Sergio
Prediction of the Number of Defectives in a Production Batch of Semiconductor Devices
2023-01-01 Ahmed, Ibrahim; Baraldi, Piero; Zio, Enrico; and Horst Lewitschnig,
Risk-informed approach to the safety improvement of the reactor protection system of the AGN-201K research reactor
2020-01-01 Ahmed, I.; Zio, E.; Heo, G.