AHMED, IBRAHIM
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A Method based on Gaussian Process Regression for Modelling Burn-in of Semiconductor Devices
2021-01-01 Baraldi, Piero; Medici, Stefano; Ahmed, Ibrahim; Zio, Enrico; Lewitschnig, Horst
Risk-informed approach to the safety improvement of the reactor protection system of the AGN-201K research reactor
2020-01-01 Ahmed, I.; Zio, E.; Heo, G.
Titolo | Data di pubblicazione | Autori | File |
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A Method based on Gaussian Process Regression for Modelling Burn-in of Semiconductor Devices | 1-gen-2021 | Baraldi, PieroAhmed, IbrahimZio, EnricoLewitschnig, Horst + | |
Risk-informed approach to the safety improvement of the reactor protection system of the AGN-201K research reactor | 1-gen-2020 | Ahmed I.Zio E. + |