AHMED, IBRAHIM

AHMED, IBRAHIM  

DIPARTIMENTO DI ENERGIA  

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Risultati 1 - 11 di 11 (tempo di esecuzione: 0.02 secondi).
Titolo Data di pubblicazione Autori File
A Grey-Box Digital Twin-based Approach for Risk Monitoring of Nuclear Power Plants 1-gen-2022 Miqueles, LeonardoAhmed, IbrahimMaio, Francesco DiZio, Enrico
A Method based on Gaussian Process Regression for Modelling Burn-in of Semiconductor Devices 1-gen-2021 Baraldi, PieroAhmed, IbrahimZio, EnricoLewitschnig, Horst +
A Multistage Physics-Informed Neural Network for Fault Detection in Regulating Valves of Nuclear Power Plants 1-gen-2024 Lai C.Ahmed I.Zio E. +
A novel methodology based on long short-term memory stacked autoencoders for unsupervised detection of abnormal working conditions in semiconductor manufacturing systems 1-gen-2024 Fatemeh HosseinpourIbrahim AhmedPiero BaraldiEnrico Zio +
An Artificial Intelligence-Based Framework for Burn-in Reduction in the Semiconductor Manufacturing Industry 1-gen-2024 Ibrahim AhmedFatemeh HosseinpourPiero BaraldiEnrico Zio +
Enhancing accuracy of prediction of critical heat flux in Circular channels by ensemble of deep sparse autoencoders and deep neural Networks 1-gen-2024 Ahmed I.Zio E. +
Estimation of the Case Temperature of Insulated Gate Bipolar Temperatures in Induction Cooktops by Deep Neural Network 1-gen-2022 Ahmed, IbrahimBaraldi, PieroLai, ChenyangZio, Enrico +
Fault Detection by Signal Reconstruction in Nuclear Power Plants 1-gen-2022 Ibrahim AhmedEnrico ZioGyunyoung Heo
Monitoring Degradation of Insulated Gate Bipolar Transistors in Induction Cooktops by Artificial Neural Networks 1-gen-2022 Chenyang LaiPiero BaraldiIbrahim AhmedEnrico Zio +
Prediction of the Number of Defectives in a Production Batch of Semiconductor Devices 1-gen-2023 Ahmed IbrahimPiero BaraldiEnrico Zio +
Risk-informed approach to the safety improvement of the reactor protection system of the AGN-201K research reactor 1-gen-2020 Ahmed I.Zio E. +