AHMED, IBRAHIM
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A Grey-Box Digital Twin-based Approach for Risk Monitoring of Nuclear Power Plants
2022-01-01 Miqueles, Leonardo; Ahmed, Ibrahim; Maio, Francesco Di; Zio, Enrico
A Method based on Gaussian Process Regression for Modelling Burn-in of Semiconductor Devices
2021-01-01 Baraldi, Piero; Medici, Stefano; Ahmed, Ibrahim; Zio, Enrico; Lewitschnig, Horst
Estimation of the Case Temperature of Insulated Gate Bipolar Temperatures in Induction Cooktops by Deep Neural Network
2022-01-01 Juybari, Mohammad N.; Ahmed, Ibrahim; Baraldi, Piero; Cueto, Alejandro Del; Gil, Javier; Lai, Chenyang; Llorente, Sergio; Zio, Enrico
Monitoring Degradation of Insulated Gate Bipolar Transistors in Induction Cooktops by Artificial Neural Networks
2022-01-01 Lai, Chenyang; Baraldi, Piero; Ahmed, Ibrahim; Zio, Enrico; del Cueto, Alejandro; Gil, Javier; Llorente, Sergio
Prediction of the Number of Defectives in a Production Batch of Semiconductor Devices
2023-01-01 Ahmed, Ibrahim; Baraldi, Piero; Zio, Enrico; and Horst Lewitschnig,