A novel methodology based on long short-term memory stacked autoencoders for unsupervised detection of abnormal working conditions in semiconductor manufacturing systems
Fatemeh Hosseinpour;Ibrahim Ahmed;Piero Baraldi;Enrico Zio;
2024-01-01
File in questo prodotto:
File | Dimensione | Formato | |
---|---|---|---|
hosseinpour-et-al-2024-a-novel-methodology-based-on-long-short-term-memory-stacked-autoencoders-for-unsupervised.pdf
Accesso riservato
Dimensione
1.93 MB
Formato
Adobe PDF
|
1.93 MB | Adobe PDF | Visualizza/Apri |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.