CIOCCHINI, NICOLA

CIOCCHINI, NICOLA  

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Risultati 1 - 13 di 13 (tempo di esecuzione: 0.022 secondi).
Titolo Data di pubblicazione Autori File
Bipolar switching operation in phase change memory devices for high temperature retention 1-gen-2016 N. CiocchiniM. LaudatoE. VaresiA. L. LacaitaD. Ielmini +
Bipolar-switching operated phase change memory (PCM) for improved high-temperature reliability 1-gen-2016 CIOCCHINI, NICOLALAUDATO, MARIOLACAITA, ANDREA LEONARDOIELMINI, DANIELE +
Intrinsic retention statistics in phase change memory (PCM) arrays 1-gen-2013 RIZZI, MAURIZIOCIOCCHINI, NICOLALACAITA, ANDREA LEONARDOIELMINI, DANIELE +
Inverse time voltage relation of threshold switching in phase change materials 1-gen-2012 CIOCCHINI, NICOLAIELMINI, DANIELE +
Modeling of crystallization kinetics in phase change memories for set and read disturb regimes 1-gen-2014 CIOCCHINI, NICOLAIELMINI, DANIELE
Modeling of Threshold Voltage Drift in Phase Change Memory (PCM) Devices 1-gen-2012 CIOCCHINI, NICOLAFUGAZZA, DAVIDEIELMINI, DANIELE +
Non-Arrhenius pulse-induced crystallization in phase change memories In corso di stampa CIOCCHINI, NICOLAFUGAZZA, DAVIDEIELMINI, DANIELE +
Reset-induced variability of retention characteristics in phase change memory (PCM) 1-gen-2014 RIZZI, MAURIZIOCIOCCHINI, NICOLALACAITA, ANDREA LEONARDOIELMINI, DANIELE +
Set/reset statistics and kinetics in phase change memory arrays 1-gen-2014 RIZZI, MAURIZIOCIOCCHINI, NICOLAIELMINI, DANIELE +
Statistics of set transition in phase change memory (PCM) arrays 1-gen-2014 CIOCCHINI, NICOLAIELMINI, DANIELE +
Threshold voltage drift in phase change memories: scaling and modeling 1-gen-2012 CIOCCHINI, NICOLAFUGAZZA, DAVIDEIELMINI, DANIELE +
Unified reliability modeling of Ge-rich phase change memory for embedded applications 1-gen-2013 CIOCCHINI, NICOLAIELMINI, DANIELE +
Universal Thermoelectric Characteristic in Phase Change Memories 1-gen-2015 CIOCCHINI, NICOLALAUDATO, MARIOLACAITA, ANDREA LEONARDOIELMINI, DANIELE +