VANACORE, GIOVANNI MARIA
Elastic strain relief in a single lithographic SiGe nanostructure by nanobeam X-ray diffraction
2010-01-01 Tagliaferri, Alberto; Chrastina, Daniel; Vanacore, GIOVANNI MARIA; Zani, Maurizio; Bollani, Monica; Schöder, S.; Burghammer, M.; Boye, P.; Isella, Giovanni; Sordan, Roman
Embedded Ga nanoparticles on patterned Si substrate
2013-01-01 S., Bietti; Bollani, Monica; C., Frigeri; K., Reyes; P., Smereka; J. M., Millunchick; Chrastina, Daniel; Vanacore, GIOVANNI MARIA; M., Burghammer; Tagliaferri, Alberto; S., Sanguinetti
Ge on C-covered Si(100) surface: from continuous surface diffusion to discrete islands nucleation
2013-01-01 Zani, Maurizio; Vanacore, GIOVANNI MARIA; Isella, Giovanni; Osmond, Johann; Bollani, Monica; Tagliaferri, Alberto
Nanoscale mapping of strain, composition and electronic structure in SiGe nano-stripes
2011-01-01 Vanacore, GIOVANNI MARIA; M., Chaigneau; N., Barrett; Bollani, Monica; Chrastina, Daniel; Isella, Giovanni; O., Renault; F., Sirotti; Sordan, Roman; Zani, Maurizio; R., Ossikovski; Tagliaferri, Alberto
Nanoscale mapping of strain, composition and electronic structure in SiGe nano-stripes
2011-01-01 Vanacore, GIOVANNI MARIA; M., Chaigneau; N., Barrett; Bollani, Monica; Chrastina, Daniel; Isella, Giovanni; O., Renault; F., Sirotti; Sordan, Roman; Zani, Maurizio; R., Ossikovski; Tagliaferri, Alberto
Ordered Ga nanoparticles embedded in GaAs islands on patterned Si substrate
2013-01-01 S., Bietti; Bollani, Monica; C., Frigeri; K., Reyes; P., Smereka; J. M., Millunchick; Chrastina, Daniel; Vanacore, GIOVANNI MARIA; M., Burghammer; Tagliaferri, Alberto; S., Sanguinetti
Scanning Auger Micro-spectroscopy for thickness evaluation of Graphene and Graphene Oxide layers
2015-01-01 Pietralunga, SILVIA MARIA; Dastjerdi, M. J. Vahid; Polloni, L.; Rizzi, LAURA GIORGIA; Sordan, Roman; Russo, Valeria; Vanacore, GIOVANNI MARIA; Zani, Maurizio; Tagliaferri, Alberto