Sfoglia per Autore
Vanadium films on Fe(1 0 0) studied by spin-resolved inverse photoemission
1997-01-01 Ciccacci, Franco; S., De Rossi; Isella, Giovanni; A., Magnoni
Structural and magnetic properties of the Ce/Fe(001) interface: a spin resolved inverse photoemission study
1999-01-01 Bertacco, Riccardo; L., Duo'; Isella, Giovanni; Ciccacci, Franco
Structural and magnetic properties of the Ce/Fe(001) interface: A spin resolved inverse photoemission study
1999-01-01 Bertacco, Riccardo; Duo', Lamberto; Isella, Giovanni; Ciccacci, Franco
A low cost modulation technique for magneto-optical measurements
1999-01-01 Isella, Giovanni; Puppin, Ezio
Magnetic characterization of thin films by means of electron spectroscopy techniques: a new apparatus for electron-in electron-out experiments
1999-01-01 L., Du; G., Chiaia; Ciccacci, Franco; Bertacco, Riccardo; Isella, Giovanni; B., DE MICHELIS; A., Fasana
Magnetic coupling in Fe/Cr/Fe(001) by spin resolved empty state spectroscopies
2000-01-01 Bertacco, Riccardo; Ciccacci, Franco; Duo', Lamberto; Isella, Giovanni
Electronic and magnetic properties of the Co/Fe(001) interface and the role of oxygen
2000-01-01 Bertacco, Riccardo; Ciccacci, Franco; Duo', Lamberto; Isella, Giovanni; M., Richter
Structural and electronic properties of thin Co films on Fe(001) and Fe(001)-p(1x1)O in the bcc-to-hcp transition regime
2000-01-01 Bertacco, Riccardo; Ciccacci, Franco; A., Di Bona; Duo', Lamberto; Isella, Giovanni; P., Luches; S., Valeri
Evolution of the magnetic and electronic properties of ultrathin Cr(001) film
2000-01-01 Isella, Giovanni; Bertacco, Riccardo; Zani, Maurizio; Duo', Lamberto; Ciccacci, Franco
Electronic and magnetic properties of the oxygen assisted grown Fe/Cr/Fe(001) trilayers
2001-01-01 Bertacco, Riccardo; Ciccacci, Franco; Duo', Lamberto; Isella, Giovanni
A new analyzer for spin resolved electron spectroscopies
2001-01-01 Bertacco, Riccardo; Ciccacci, Franco; Duo', Lamberto; Isella, Giovanni; Marcon, Marco
Electronic structure of epitaxial thin NiO(100) films grown on Ag(100): Towards a film experimental basis
2001-01-01 Bertacco, Riccardo; Ciccacci, Franco; Duo', Lamberto; Isella, Giovanni; Marcon, Marco; Portalupi, Marco
Spin polarized empty state spectroscopy of thin films and multilayers
2002-01-01 Isella, Giovanni; Bertacco, Riccardo; Marcon, Marco; Duo', Lamberto; Ciccacci, Franco
Very high hole mobilities in modultations-doped Ge quantum wells grown by low-energy plasma enhanced chemical vapor deposition
2002-01-01 H., Von Känel; M., Kummer; Isella, Giovanni; E., Müller; T., Hackbarth
Fabrication and modeling of gigahertz photodetectors in heteroepitaxial Ge-on-Si using a graded buffer layer deposited by low energy plasma enhanced CVD
2002-01-01 R. E., Jones; S. G., Thomas; S., Bharatan; R., Thoma; C., Jasper; T., Zirkle; N. V, Edwards; R., Liu; X. D., Wang; Q., Xie; C., Rosenblad; J., Ramm; Isella, Giovanni; H., VON KAENEL; J., Oh; J. C., Campbell
Erratum: Versatile apparatus for investigating ultrathin magnetic films (Journal of Electron Spectroscopy & Related Phenomena 122:3 (221-229) PII: S0368204801003590)
2002-01-01 Isella, G.; Marcon, Marco; Bertacco, R.; Trezzi, G.; Incorvaia, N.; Ciccacci, F.; Duo, L.
Versatile appartus for investigating ultrathin magnetic films
2002-01-01 Bertacco, Riccardo; Ciccacci, Franco; Duo', Lamberto; Incorvaia, NUNZIO ROSARIO; Isella, Giovanni; Marcon, Marco; Trezzi, Gabriele
Structural characterization of thick, high-quality epitaxial Ge on Si substrates grown by low-energy plasma-enhanced chemical vapor deposition
2003-01-01 S. G., Thomas; S., Bharatan; R. E., Jones; R., Thoma; T., Zirkle; R., Liu; X. D., Wang; Q., Xie; C., Rosenblad; J., Ramm; Isella, Giovanni; H., VON KAENEL; N. V., Edwards
Compressively strained Ge channels on relaxed SiGe buffer layers
2003-01-01 Bollani, Monica; E., Mueller; S., Signoretti; C., Beeli; Isella, Giovanni; M., Kummer; H., VON KAENEL
Effective mass in remotely doped Ge quantum wells
2003-01-01 B., Roessner; Isella, Giovanni; H., VON KAENEL
Room temperature laser operation of strained InGaAs/GaAs structure monolithically grown by MOCVD on LE-PECVD Ge/Si virtual substrate.
2003-01-01 Y., Chriqui; G., Saint Girons; S., Bouchoule; J. M., Moisons; Isella, Giovanni; H., von Kaenel; I., Sagnes
Ge quantification in SiGe relaxed buffer layers by RBS and SIMS
2004-01-01 F., SANCHEZ ALMAZAN; E., Napolitani; A., Carnera; A. V., Drigo; M., Berti; J., Stangl; Z., Zhong; G., Bauer; Isella, Giovanni; H., VON KAENEL
Scattering mechanisms in high-mobility strained-Ge channels
2004-01-01 B., Roessner; Chrastina, Daniel; Isella, Giovanni; H., VON KAENEL
High quality SiGe electronic material grown by low energy plasma enhanced chemical vapour deposition
2004-01-01 Chrastina, Daniel; Isella, Giovanni; B., Roessner; Bollani, Monica; E., Mueller; T., Hackbarth; H., VON KAENEL
Relaxed SiGe heteroepitaxy on Si with very thin buffer layers: experimental LEPECVD indications and an interpretation based on strain-dependent dislocation nature
2004-01-01 A., Marzegalli; F., Montalenti; M., Bollani; Leo, Miglio; Isella, Giovanni; Chrastina, Daniel; H., VON KAENEL
High mobility SiGe heterostructures fabricated by low-energy plasma-enhanced chemical vapor deposition
2004-01-01 VON KÄNEL, Hans; Chrastina, Daniel; B., Roessner; Isella, Giovanni; J. P., Hague; Bollani, Monica
Strained Si HFETs for microwave applications: state-of-the-art and further approaches
2004-01-01 M., ENCISO AGUILAR; M., Rodriguez; N., Zerouinian; F., Aniel; T., Hackbarth; H. J., Herzog; U., Koenig; S., Mantl; B., Hollaender; Chrastina, Daniel; Isella, Giovanni; VON KÄNEL, Hans; K., Lyyutovich; M., Oehme
Matrix effects in SIMS depth profiles of SiGe relaxed buffer layers
2004-01-01 F., SANCHEZ ALMAZAN; E., Napolitani; A., Carnera; A. V., Drigo; Isella, Giovanni; H., VON KAENEL; M., Berti
Low-energy plasma-enhanced chemical vapor deposition for strained Si and Ge heterostructures and devices
2004-01-01 Isella, Giovanni; Chrastina, Daniel; B., Rossner; T., Hackbarth; H. J., Herzog; U., Konig; VON KÄNEL, Hans
Formation of strain-induced Si-rich and Ge-rich nanowires at misfit dislocations in SiGe: A model supported by photoluminescence data
2004-01-01 L., Martinelli; A., Marzegalli; P., Raiteri; Bollani, Monica; F., Montalenti; L., Miglio; Chrastina, Daniel; Isella, Giovanni; VON KÄNEL, Hans
SJ and TJ GaAs concentrator solra cells on Si virtual wafers
2005-01-01 R., Campesato; C., Casale; C., Flores; G., Gabetta; Isella, Giovanni; G., Smekens; G., Timo'; J., Vanbegin; H., Von Kaenel
Electron-electron interaction in p-SiGe/Ge quantum wells
2005-01-01 B., Batlogg; Chrastina, Daniel; Isella, Giovanni; B., Roessner; H., Von Kaenel
LEPECVD - a production technique for SiGe MOSFETs and MODFETs
2005-01-01 Chrastina, Daniel; T., Hackbarth; C., Hague; H., Herzog; K., Hieber; Isella, Giovanni; U., Koenig; B., Roessner; H., Von Kaenel
Raman spectroscopy of Si1-xGex epilayers
2005-01-01 G., Bauer; J., Stangl; H., Von Kaenel; E., Wintersberger; Bollani, Monica; Chrastina, Daniel; E., Grilli; M., Guzzi; Isella, Giovanni; L., Martinelli; F., Pezzoli; S., Sanguinetti
Long wavelength room temperature laser operation of a strained InGaAs/GaAs quantum well structure monolithically grown by metalorganic chemical vapor deposition on a low energy-plasma enhanced chemical vapour deposition graded misoriented Ge/Si virtual substrate
2005-01-01 Y., Chriqui; G., SAINT GIRONS; Isella, Giovanni; VON KÄNEL, Hans; S., Bouchoule; I., Sagnes
X-Ray Investigation of Thick Epitaxial GaAs/InGaAs Layers on Ge Pseudosubstrates
2005-01-01 A., REHMAN KHAN; K., Mundboth; J., Stangl; G., Bauer; H., VON KAENEL; A., Federov; Isella, Giovanni; D., Colombo
InGaAs/GaAs sources monolithically grown by MOVPE on Ge/Si substrates
2005-01-01 D., Bensahel; S., Bouchoule; Y., Chriqui; Isella, Giovanni; O., Kermarrec; I., Sagnes; G., Saint Girons; H., Von Kaenel
Thin relaxed SiGe virtual substrates grown by low-energy plasma-enhanced chemical vapor deposition
2005-01-01 Chrastina, Daniel; Isella, Giovanni; Bollani, Monica; B., Rössner; E., Müller; T., Hackbarth; E., Wintersberger; Z., Zhong; J., Stangl; H., von Känel
Raman spectroscopy of Si1−xGex epilayers
2005-01-01 F., Pezzoli; L., Martinelli; E., Grilli; M., Guzzi; S., Sanguinetti; Bollani, Monica; Chrastina, Daniel; Isella, Giovanni; H., von Känel; E., Wintersberger; J., Stangl; G., Bauer
Fe thin films grown on single-crystal and virtual Ge(001) substrates
2005-01-01 Cantoni, Matteo; M., Riva; Isella, Giovanni; Bertacco, Riccardo; Ciccacci, Franco
Logic gates with a single Hall bar heterostructure
2006-01-01 Sordan, Roman; Miranda, ALESSIO MASSIMILIA; Osmond, Johann; Chrastina, Daniel; Isella, Giovanni; VON KÄNEL, Hans
Investigating the lateral motion of SiGe islands by selective chemical etching
2006-01-01 G., Katsaros; A., Rastelli; M., Stoffel; Isella, Giovanni; H., VON KAENEL; A. M., Bittner; J., Tersoff; U., Denker; O. G., Schmidt; G., Costantini; K., Kern
Characterization of Ge-on-Si virtual substrates and single junction GaAs solar cells
2006-01-01 R., Ginige; B., Corbett; M., Modreanu; C., Barrett; J., Hilgarth; Isella, Giovanni; Chrastina, Daniel; VON KÄNEL, Hans
Defect imaging of SiGe strain relaxed buffers grown by LEPECVD
2006-01-01 S., Marchionna; A., Virtuani; M., Acciarri; Isella, Giovanni; H., VON KAENEL
2-D Hole Gas with Two-Subband Occupation in a Strained Ge Channel: Scattering Mechanisms
2006-01-01 Roessner, B.; VON KÄNEL, Hans; Chrastina, Daniel; Isella, Giovanni; Batlogg, B.
Resonator fabrication for cavity enhanced, tunable Si/Ge quantum cascade detectors
2006-01-01 M., Grydlik; P., Rauter; T., Fromherz; G., Bauer; C., Falub; D., Gruetzmacher; Isella, Giovanni
Strain-induced shift of phonon modes in Si1-xGex alloys
2006-01-01 F., Pezzoli; E., Grilli; M., Guzzi; S., Sanguinetti; Chrastina, Daniel; Isella, Giovanni; H., VON KAENEL; E., Wintersberger; J., Stangl; G., Bauer
Study of Thermal Strain Relaxation in GaAs Grown on Ge/Si Substrates
2006-01-01 D., Colombo; E., Grilli; M., Guzzi; S., Sanguinetti; A., Fedorov; H., VON KAENEL; Isella, Giovanni
Electron-Beam-Induced Current Imaging for the characterisation of structural defects in Si1-xGex films grown by LEPECVD
2006-01-01 A., Virtuani; S., Marchionna; M., Acciarri; Isella, Giovanni; H., VON KAENEL
Hole band nonparabolicity and effective mass measurement in p-SiGe/Ge heterostructures
2006-01-01 B., Roessner; B., Batlogg; H., VON KAENEL; Chrastina, Daniel; Isella, Giovanni
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