A New Combined Time–Amplitude Method for the Accurate Analysis of Fast Random Telegraph Noise Waveforms Measured on Electron Devices

In this paper, we present a new method to investigate fast random telegraph noise (RTN) waveforms in the current of solid-state electron devices. The method combines the inspection of both the amplitude and the time behavior of the trace resulting from a measurement procedure based on averaging the current over a selected integration time to reduce the impact of additive white Gaussian noise (AWGN). The uncertainty of the method in the extraction of the parameters of the RTN waveform from which the measured current trace originates is compared to that of alternative approaches, namely the hidden Markov model (HMM) method and the amplitude analysis (AA) method. Results reveal that the proposed method is more accurate than the HMM method in the case of RTN waveforms with average dwell times comparable to or shorter than the integration time and more robust than the AA method against AWGN. An approach to identify the applicability of the method to the extraction of the parameters of an RTN waveform is, finally, proposed.