The electrical and thermal parameters of phase change memory (PCM) cells are modified by cycling-induced mechanisms. In this letter, an adaptive cycling procedure is introduced to provide an endurance characterization by keeping the peak temperature at the heater/chalcogenide interface almost constant despite the cell parameters Variations. Experimental results on the PCM wall architecture are collected and explained by considering the reduction of the heater electrical/thermal resistances and the impact of crystallization kinetics variation during cycling.

Study of Cycling-Induced Parameter Variations in Phase Change Memory Cells

BONIARDI, MATTIA;REDAELLI, ANDREA;LACAITA, ANDREA LEONARDO
2013

Abstract

The electrical and thermal parameters of phase change memory (PCM) cells are modified by cycling-induced mechanisms. In this letter, an adaptive cycling procedure is introduced to provide an endurance characterization by keeping the peak temperature at the heater/chalcogenide interface almost constant despite the cell parameters Variations. Experimental results on the PCM wall architecture are collected and explained by considering the reduction of the heater electrical/thermal resistances and the impact of crystallization kinetics variation during cycling.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11311/765352
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