New Design for Testability techniques aimed both at overcoming the problem of testing array architectures composed of sequential cells and at guaranteeing fault tolerance through reconfiguration are proposed.
Two-Dimensional Sequential Array Architectures: Design for Testability and Reconfiguration Issues
BOLCHINI, CRISTIANA;SCIUTO, DONATELLA
1993-01-01
Abstract
New Design for Testability techniques aimed both at overcoming the problem of testing array architectures composed of sequential cells and at guaranteeing fault tolerance through reconfiguration are proposed.File in questo prodotto:
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