The aim of this paper is the presentation of a new method- ologyforfast testpattern generationfir difficultfaults. A BDD-based algorithm is applied as back-end of a standard A TPG (e.g. SOCRATES, FAN, PODEM) thusproviding a solution to their ineficiency in difficult faults analysis. Experimental results show the effectiveness of the proposed approachon a number of benchmark circuits.
A BDD based algorithm for detecting difficult faults
BOLCHINI, CRISTIANA;SALICE, FABIO
1995-01-01
Abstract
The aim of this paper is the presentation of a new method- ologyforfast testpattern generationfir difficultfaults. A BDD-based algorithm is applied as back-end of a standard A TPG (e.g. SOCRATES, FAN, PODEM) thusproviding a solution to their ineficiency in difficult faults analysis. Experimental results show the effectiveness of the proposed approachon a number of benchmark circuits.File in questo prodotto:
| File | Dimensione | Formato | |
|---|---|---|---|
|
00523818.pdf
Accesso riservato
:
Post-Print (DRAFT o Author’s Accepted Manuscript-AAM)
Dimensione
421.66 kB
Formato
Adobe PDF
|
421.66 kB | Adobe PDF | Visualizza/Apri |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
