The aim of this paper is the presentation of a new method- ologyforfast testpattern generationfir difficultfaults. A BDD-based algorithm is applied as back-end of a standard A TPG (e.g. SOCRATES, FAN, PODEM) thusproviding a solution to their ineficiency in difficult faults analysis. Experimental results show the effectiveness of the proposed approachon a number of benchmark circuits.

A BDD based algorithm for detecting difficult faults

BOLCHINI, CRISTIANA;SALICE, FABIO
1995-01-01

Abstract

The aim of this paper is the presentation of a new method- ologyforfast testpattern generationfir difficultfaults. A BDD-based algorithm is applied as back-end of a standard A TPG (e.g. SOCRATES, FAN, PODEM) thusproviding a solution to their ineficiency in difficult faults analysis. Experimental results show the effectiveness of the proposed approachon a number of benchmark circuits.
1995
Proc. ISCAS'95 - International Symposium on Circuits and Systems
0780325702
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11311/653943
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