Epistemic uncertainty analysis accounts for inaccurate input parameters and evaluates how such uncertainty propagates to output measures. In this work we will focus on Weibull distributions, in particular the one related to the reliability of multi-core systems-on-chips. We focus on a two-core system in which, when one of the cores fails, the other can take care of all the systems' tasks. However, this results in an increased operational temperature that leads to a reduced lifetime. We first discuss the epistemic uncertainty distribution that we expect when we estimate the scale parameter of a Weibull distribution from a limited set of samples. We then extend the procedure to consider the epistemic uncertainty in the two core system-on-chip when we can measure the failure times of the first and of the second core.

Epistemic uncertainty propagation in a Weibull environment for a two-core system-on-chip

Pinciroli, Riccardo;BOBBIO, ROBERTO ANDREA;Bolchini, Cristiana;Cerotti, Davide;Gribaudo, Marco;Miele, Antonio;TRIVEDI, KISHOR SHRIDHARBHAI
2017

Abstract

Epistemic uncertainty analysis accounts for inaccurate input parameters and evaluates how such uncertainty propagates to output measures. In this work we will focus on Weibull distributions, in particular the one related to the reliability of multi-core systems-on-chips. We focus on a two-core system in which, when one of the cores fails, the other can take care of all the systems' tasks. However, this results in an increased operational temperature that leads to a reduced lifetime. We first discuss the epistemic uncertainty distribution that we expect when we estimate the scale parameter of a Weibull distribution from a limited set of samples. We then extend the procedure to consider the epistemic uncertainty in the two core system-on-chip when we can measure the failure times of the first and of the second core.
Proceedings of 2nd International Conference on System Reliability and Safety, ICSRS 2017
9781538633229
epistemic uncertainty; min/max weibull distributions; multi-core system-on-chip; uncertainty propagation; weibull distribution; Safety, Risk, Reliability and Quality; Control and Optimization; Modeling and Simulation
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11311/1063998
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