statistiche ricercatore

Nome	#
A Method based on Gaussian Process Regression for Modelling Burn-in of Semiconductor Devices	55
An Artificial Intelligence-Based Framework for Burn-in Reduction in the Semiconductor Manufacturing Industry	32
A Grey-Box Digital Twin-based Approach for Risk Monitoring of Nuclear Power Plants	32
Risk-informed approach to the safety improvement of the reactor protection system of the AGN-201K research reactor	27
Monitoring Degradation of Insulated Gate Bipolar Transistors in Induction Cooktops by Artificial Neural Networks	18
A novel methodology based on long short-term memory stacked autoencoders for unsupervised detection of abnormal working conditions in semiconductor manufacturing systems	17
Prediction of the Number of Defectives in a Production Batch of Semiconductor Devices	16
Fault Detection by Signal Reconstruction in Nuclear Power Plants	16
Enhancing accuracy of prediction of critical heat flux in Circular channels by ensemble of deep sparse autoencoders and deep neural Networks	16
Integration of artificial intelligence within an advanced filtering framework for real-time system state estimation and risk prediction with application to a nuclear microreactor	15
Estimation of the Case Temperature of Insulated Gate Bipolar Temperatures in Induction Cooktops by Deep Neural Network	15
A Multistage Physics-Informed Neural Network for Fault Detection in Regulating Valves of Nuclear Power Plants	10
Totale	269

	Totale	Lug	Ago	Sett	Ott	Nov	Dic	Gen	Feb	Mar	Apr	Mag	Giu
2020/2021	5	0	0	0	0	0	0	0	1	2	0	2	0
2021/2022	7	1	0	0	0	0	2	1	0	1	0	1	1
2022/2023	11	1	0	0	0	0	0	1	3	2	2	1	1
2023/2024	73	5	3	1	1	8	6	0	21	3	8	6	11
2024/2025	173	5	1	7	3	31	21	30	62	13	0	0	0
Totale													269

RE.PUBLIC@POLIMI pubblicazioni di ricerca del Politecnico di Milano