A Novel Approach to Incremental Functional Diagnosis for Complex Electronic Boards

Incremental functional diagnosis aims at minimising the number of tests to be executed to perform the diagnosis, to limit efforts and costs. Iteratively the test to be executed is selected and based on the collected outcome, either the faulty component is identified or a new test is performed. This paper proposes a novel approach based on the syndromes occurrence probability, that defines how i) to process syndromes compatible with the partial syndrome being incrementally collected and ii) to select the next test. The proposal is evaluated and compared against a number of existing techniques based on machine-learning strategies, outperforming them.