The combined effects of devices increased complexity and reduced design cycle time creates a testing problem: an increasing larger portion of the design time is devoted to testing and verification. Today EDA tools, moving towards higher levels of abstraction, promise greater designer productivity, resulting in increased design complexity and size. In order to reduce the testing and verification time, different high-level approaches have been proposed in literature. Most of these approaches are based on the definition of an error or fault model, applicable at a higher level of abstraction of the description of the system to be implemented. In this paper we concentrate our attention on the evaluation of error models, used in test generation and in functional verification. Evaluation of error models is also an important aspect when fault injection methodologies are used to evaluate the dependability of complex system

Error simulation based on the SystemC design description language

BRUSCHI, FRANCESCO;FERRANDI, FABRIZIO;SCIUTO, DONATELLA
2002-01-01

Abstract

The combined effects of devices increased complexity and reduced design cycle time creates a testing problem: an increasing larger portion of the design time is devoted to testing and verification. Today EDA tools, moving towards higher levels of abstraction, promise greater designer productivity, resulting in increased design complexity and size. In order to reduce the testing and verification time, different high-level approaches have been proposed in literature. Most of these approaches are based on the definition of an error or fault model, applicable at a higher level of abstraction of the description of the system to be implemented. In this paper we concentrate our attention on the evaluation of error models, used in test generation and in functional verification. Evaluation of error models is also an important aspect when fault injection methodologies are used to evaluate the dependability of complex system
Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11311/240414
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