The Special Issue “Advancements in Optical Measurement Devices and Technologies” brings together state-of-the-art research on optical metrology techniques and devices that enhance precision measurement across scientific and industrial applications. This collection highlights innovative sensors, imaging and spectroscopy methods, advanced interferometry, and practical measurement systems for microfluidics, quantum standards, surface characterization, and laser scanning, demonstrating their contributions to metrological accuracy and real-world deployment.
Advancements in Optical Measurement Devices and Technologies
M. Norgia
2026-01-01
Abstract
The Special Issue “Advancements in Optical Measurement Devices and Technologies” brings together state-of-the-art research on optical metrology techniques and devices that enhance precision measurement across scientific and industrial applications. This collection highlights innovative sensors, imaging and spectroscopy methods, advanced interferometry, and practical measurement systems for microfluidics, quantum standards, surface characterization, and laser scanning, demonstrating their contributions to metrological accuracy and real-world deployment.File in questo prodotto:
| File | Dimensione | Formato | |
|---|---|---|---|
|
contributo libro compresso.pdf
accesso aperto
Descrizione: libro
:
Publisher’s version
Dimensione
9.66 MB
Formato
Adobe PDF
|
9.66 MB | Adobe PDF | Visualizza/Apri |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
