This paper presents a complementary (nMOS and pMOS) bootstrapped sampler. The proposed solution is implemented in 28-nm bulk CMOS technology with a 0.9-V supply voltage and integrated with a 250-MS/s Successive Approximation Register (SAR) Analog-to-Digital Converter (ADC). Simulations demonstrate that this topology minimizes on-resistance modulation and charge injection effects, leading to a Total Harmonic Distortion (THD) enhancement of -25-dB at low frequencies and -10-dB at high frequencies compared to the conventional nMOSbased bootstrapped sampler.

A Complementary Bootstrapped Sampler for High-Frequency High-Resolution ADCs

Alessia Ceroni;Gabriele Zanoletti;Enrico Albezzano;Andrea Giovanni Bonfanti;Carlo Samori
2025-01-01

Abstract

This paper presents a complementary (nMOS and pMOS) bootstrapped sampler. The proposed solution is implemented in 28-nm bulk CMOS technology with a 0.9-V supply voltage and integrated with a 250-MS/s Successive Approximation Register (SAR) Analog-to-Digital Converter (ADC). Simulations demonstrate that this topology minimizes on-resistance modulation and charge injection effects, leading to a Total Harmonic Distortion (THD) enhancement of -25-dB at low frequencies and -10-dB at high frequencies compared to the conventional nMOSbased bootstrapped sampler.
2025
2025 IEEE International Conference on IC Design and Technology (ICICDT)
Sample and Hold circuit, On-resistance modulation, Charge Injection, Analog-to-Digital Converters
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11311/1286189
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