We present an innovative beamline for extreme ultraviolet (XUV)-infrared (IR) pump-probe reflection spectroscopy in solids with attosecond temporal resolution. The setup uses an actively stabilized interferometer, where attosecond pulse trains or isolated attosecond pulses are produced by high-order harmonic generation in gases. After collinear recombination, the attosecond XUV pulses and the femtosecond IR pulses are focused twice in sequence by toroidal mirrors, giving two spatially separated interaction regions. In the first region, the combination of a gas target with a time-of-flight spectrometer allows for attosecond photoelectron spectroscopy experiments. In the second focal region, an XUV reflectometer is used for attosecond transient reflection spectroscopy (ATRS) experiments. Since the two measurements can be performed simultaneously, precise pump-probe delay calibration can be achieved, thus opening the possibility for a new class of attosecond experiments on solids. Successful operation of the beamline is demonstrated by the generation and characterization of isolated attosecond pulses, the measurement of the absolute reflectivity of SiO2, and by performing simultaneous photoemission/ATRS in Ge.

Novel beamline for attosecond transient reflection spectroscopy in a sequential two-foci geometry

Lucarelli G. D.;Moio B.;Inzani G.;Moscardi L.;Nisoli M.;Lucchini M.
2020

Abstract

We present an innovative beamline for extreme ultraviolet (XUV)-infrared (IR) pump-probe reflection spectroscopy in solids with attosecond temporal resolution. The setup uses an actively stabilized interferometer, where attosecond pulse trains or isolated attosecond pulses are produced by high-order harmonic generation in gases. After collinear recombination, the attosecond XUV pulses and the femtosecond IR pulses are focused twice in sequence by toroidal mirrors, giving two spatially separated interaction regions. In the first region, the combination of a gas target with a time-of-flight spectrometer allows for attosecond photoelectron spectroscopy experiments. In the second focal region, an XUV reflectometer is used for attosecond transient reflection spectroscopy (ATRS) experiments. Since the two measurements can be performed simultaneously, precise pump-probe delay calibration can be achieved, thus opening the possibility for a new class of attosecond experiments on solids. Successful operation of the beamline is demonstrated by the generation and characterization of isolated attosecond pulses, the measurement of the absolute reflectivity of SiO2, and by performing simultaneous photoemission/ATRS in Ge.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11311/1141373
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