A test setup based on crosstalk (XT) is designed to stress the equipment under test (EUT) with similar levels of interference as those in conventional radiated-susceptibility (RS) tests. Transmission-line theory is used to model both XT and RS test setups, and derive deterministic conditions of equivalence. At first, the forward power of the RF source (used to feed the XT test setup) is expressed in terms of known geometrical/electrical parameters of the test setup, including the impedance of the auxiliary equipment (AE) connected at the cable terminal opposite the EUT. Then, this quantity (generally unknown to test operators) is treated as a random variable, and statistical equivalent conditions for the XT-based test are derived. In particular, the proposed forward-power level ensures execution of a worst-case XT test which is more severe than the RS test in any case. The excess of injected interference is characterized through cumulative distribution functions.

Crosstalk-based radiated susceptibility test enforcing worst-case conditions and quantified overtesting margin

LIANG, TAO;Spadacini, Giordano;Grassi, Flavia;Pignari, Sergio A.
2017-01-01

Abstract

A test setup based on crosstalk (XT) is designed to stress the equipment under test (EUT) with similar levels of interference as those in conventional radiated-susceptibility (RS) tests. Transmission-line theory is used to model both XT and RS test setups, and derive deterministic conditions of equivalence. At first, the forward power of the RF source (used to feed the XT test setup) is expressed in terms of known geometrical/electrical parameters of the test setup, including the impedance of the auxiliary equipment (AE) connected at the cable terminal opposite the EUT. Then, this quantity (generally unknown to test operators) is treated as a random variable, and statistical equivalent conditions for the XT-based test are derived. In particular, the proposed forward-power level ensures execution of a worst-case XT test which is more severe than the RS test in any case. The excess of injected interference is characterized through cumulative distribution functions.
2017
Proceedings of 2017 IEEE 5th International Symposium on Electromagnetic Compatibility (EMC-Beijing)
978-1-5090-5184-7
978-1-5090-5185-4
ELETTRICI
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11311/1060352
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