Practical Aspects in mCSEM Migration

It is widely known that the main framework for mCSEM imaging is the mathematical inversion of data, that in real applications (thus 3D model geometries) require great computational resources to be accomplished in reasonable time. It is also known from literature that non-inversion based imaging, through migration algorithms, both iterative or not, are feasible with a computational cost far lower with respect to inversion, although yielding images of resistivity contrasts or an apparent resistivity, but not a reliable resistivity estimation and associated uncertainty. Here some practical aspects of one-pass mCSEM migration and suggestions for some imaging improvement are analyzed.