BEJANI, MEHDI
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AI-Assisted Framework for Real-Time Monitoring and Management of Probe Cards in Electrical Wafer Sort Applications
2025-01-01 Bejani, M.; Appello, D.; Mauri, M.; Todaro, S.; Mariani, S.
Digital Twin-Assisted Optimal Sensor Placement for Real-Time Monitoring of Probe Cards in EWS Applications
2025-01-01 Bejani, Mehdi; Appello, Davide; Mauri, Marco; Missaglia, Elia; Mariani, Stefano
| Titolo | Data di pubblicazione | Autori | File |
|---|---|---|---|
| AI-Assisted Framework for Real-Time Monitoring and Management of Probe Cards in Electrical Wafer Sort Applications | 1-gen-2025 | Bejani M.Mariani S. + | |
| Digital Twin-Assisted Optimal Sensor Placement for Real-Time Monitoring of Probe Cards in EWS Applications | 1-gen-2025 | Bejani, MehdiMariani, Stefano + |