BEJANI, MEHDI
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AI-Assisted Framework for Real-Time Monitoring and Management of Probe Cards in Electrical Wafer Sort Applications
2025-01-01 Bejani, M.; Appello, D.; Mauri, M.; Todaro, S.; Mariani, S.
Digital Twin-Assisted Optimal Sensor Placement for Real-Time Monitoring of Probe Cards in EWS Applications
2025-01-01 Bejani, Mehdi; Appello, Davide; Mauri, Marco; Missaglia, Elia; Mariani, Stefano
Self-Attention-Based Deep Learning for Missing Sensor Data Imputation in Real-Time Probe Card Monitoring
2025-01-01 Bejani, Mehdi; Mauri, Marco; Mariani, Stefano