RITIK, RITIK
 Distribuzione geografica
Continente #
NA - Nord America 147
EU - Europa 91
AS - Asia 25
Continente sconosciuto - Info sul continente non disponibili 14
SA - Sud America 2
Totale 279
Nazione #
US - Stati Uniti d'America 135
IT - Italia 71
JP - Giappone 10
SE - Svezia 9
CN - Cina 7
CA - Canada 6
SG - Singapore 5
DE - Germania 3
BR - Brasile 2
FI - Finlandia 2
GB - Regno Unito 2
NL - Olanda 2
AG - Antigua e Barbuda 1
BB - Barbados 1
BD - Bangladesh 1
CR - Costa Rica 1
CU - Cuba 1
CZ - Repubblica Ceca 1
DK - Danimarca 1
HK - Hong Kong 1
JM - Giamaica 1
KR - Corea 1
TT - Trinidad e Tobago 1
Totale 265
Città #
Milan 20
San Jose 16
Council Bluffs 15
Ashburn 13
Phoenix 10
Tokyo 5
Naples 4
Singapore 4
Boardman 3
Bologna 3
Santa Clara 3
Amsterdam 2
Bari 2
Brasília 2
Brooklyn 2
Eschborn 2
Montreal 2
Osaka 2
Rome 2
Alsip 1
Atlanta 1
Beijing 1
Bohemia 1
Bridgeton 1
Bridgetown 1
Chaguanas 1
Chicago 1
Colorado Springs 1
Compton 1
Dallas 1
Decatur 1
Detroit 1
Fort Wayne 1
Fresno 1
Fullerton 1
Greenfield Park 1
Guagnano 1
Göttingen 1
Hackney 1
Hamilton 1
Hangzhou 1
Havana 1
Hemet 1
Houston 1
Ipswich 1
Jyväskylä 1
Krnov 1
Lecce 1
Legnano 1
Lehigh Acres 1
Lincoln 1
Malonno 1
Maple Shade Township 1
Marion 1
Miami 1
Miano 1
Montego Bay 1
Mount Vernon 1
New York 1
Newark 1
Oxnard 1
Palermo 1
Pescara 1
Philadelphia 1
Pineto 1
Powder Springs 1
Princeton 1
Salt Lake City 1
San José 1
Seoul 1
St John's 1
St. Catharines 1
Summerville 1
The Bronx 1
Toronto 1
Warminster 1
Warner Robins 1
Totale 170
Nome #
Secondary-Electron-Energy-Spectroscopy (SEES) for Semiconductor Surface Defect Characterization 48
Graphene Membrane Electrochemical Cell for High-Vacuum SEM Observation of Electrocatalytic Reactions 42
IM1-P-7 Quantum state secondary electron emission spectroscopy in low voltage scanning electron microscope for probing Valence band 36
IM1-O-3 Perspectives of ultrafast hyperspectral imaging in Scanning Electron Microscopy 32
High-Vacuum Scanning Electron Microscopy Characterization of Electrochemical Reactions 28
IM3-P-8 Surface and sub-surface defect analysis in semiconductors by Secondary Electron Emission Spectroscopy and local charge transport mapping 25
Perspectives of ultrafast hyperspectral imaging in Scanning Electron Microscopy 24
Surface and defect analysis in advanced materials: leveraging EBIC and SEES in SEM 23
Surface and sub-surface defect analysis in semiconductors by Secondary Electron Emission Spectroscopy and local charge transport mapping 21
Totale 279
Categoria #
all - tutte 598
article - articoli 0
book - libri 0
conference - conferenze 598
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 1.196


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2026/2027279 0 172 86 21 0 0 0 0 0 0 0 0
Totale 279