We present the design and the first experimental characterization of VEGA, an Application Specific Integrated Circuit (ASIC) designed to read out large area monolithic linear Silicon Drift Detectors (SDD’s). VEGA consists of an analog and a digital/mixed-signal section to accomplish all the functionalities and specifications required for high resolution X-ray spectroscopy in the energy range between 500 eV and 50 keV. The analog section includes a charge sensitive preamplifier, a shaper with 3-bit digitally selectable shaping times from 1.6 µs to 6.6 µs and a peak stretcher/sample-and-hold stage. The digital/mixed-signal section includes an amplitude discriminator with coarse and fine threshold level setting, a peak discriminator and a logic circuit to fulfill pile-up rejection, signal sampling, trigger generation, channel reset and the preamplifier and discriminators disabling functionalities. A Serial Peripherical Interface (SPI) is integrated in VEGA for loading and storing all configuration parameters in an internal register within few microseconds. The VEGA ASIC has been designed and manufactured in 0.35 µm CMOS mixed-signal technology in single and 32 channel versions with dimensions of 200 µm×500 µm per channel. A minimum intrinsic Equivalent Noise Charge (ENC) of 12 electrons r.m.s. at 3.6 µs peaking time and room temperature is measured and the linearity error is between −0.9% and +0.6% in the whole input energy range. The total power consumption is 481 µW and 420 µW per channel for the single and 32 channels version, respectively. A comparison with other ASICs for X-ray SDD’s shows that VEGA has a suitable low noise and offers high functionality as ADC-ready signal processing but at a power consumption that is a factor of four lower than other similar existing ASICs.
VEGA: A low-power front-end ASIC for large area multi-linear X-ray silicon drift detectors: Design and experimental characterization
AHANGARIANABHARI, MAHDI;MACERA, DANIELE;BERTUCCIO, GIUSEPPE;
2015-01-01
Abstract
We present the design and the first experimental characterization of VEGA, an Application Specific Integrated Circuit (ASIC) designed to read out large area monolithic linear Silicon Drift Detectors (SDD’s). VEGA consists of an analog and a digital/mixed-signal section to accomplish all the functionalities and specifications required for high resolution X-ray spectroscopy in the energy range between 500 eV and 50 keV. The analog section includes a charge sensitive preamplifier, a shaper with 3-bit digitally selectable shaping times from 1.6 µs to 6.6 µs and a peak stretcher/sample-and-hold stage. The digital/mixed-signal section includes an amplitude discriminator with coarse and fine threshold level setting, a peak discriminator and a logic circuit to fulfill pile-up rejection, signal sampling, trigger generation, channel reset and the preamplifier and discriminators disabling functionalities. A Serial Peripherical Interface (SPI) is integrated in VEGA for loading and storing all configuration parameters in an internal register within few microseconds. The VEGA ASIC has been designed and manufactured in 0.35 µm CMOS mixed-signal technology in single and 32 channel versions with dimensions of 200 µm×500 µm per channel. A minimum intrinsic Equivalent Noise Charge (ENC) of 12 electrons r.m.s. at 3.6 µs peaking time and room temperature is measured and the linearity error is between −0.9% and +0.6% in the whole input energy range. The total power consumption is 481 µW and 420 µW per channel for the single and 32 channels version, respectively. A comparison with other ASICs for X-ray SDD’s shows that VEGA has a suitable low noise and offers high functionality as ADC-ready signal processing but at a power consumption that is a factor of four lower than other similar existing ASICs.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
